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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ | 2023-06-09 16:20 |
Hokkaido | Otaru Chamber of Commerce & Industry (Primary: On-site, Secondary: Online) |
Estimating Transmission Efficiency of Intentional Electromagnetic Interference Using Fault Occurrence Rate from Cryptographic Devices Hikaru Nishiyama, Daisuke Fujimoto, Yuichi Hayashi (NAIST)  EMCJ2023-28 |
Fault injection attacks using intentional electromagnetic interference (IEMI) against cryptographic devices have become ... [more] | EMCJ2023-28 pp.82-86 |
| HWS, ICD [detail] | 2021-10-19 10:50 |
Online | Online | Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17 |
A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave ... [more] | HWS2021-43 ICD2021-17 pp.13-18 |
| ICD, HWS [detail] | 2020-10-26 09:50 |
Online | Online | Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference
-- Impact of Impedance Change in Digital Output Circuits -- Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST) HWS2020-27 ICD2020-16 |
New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity... [more] | HWS2020-27 ICD2020-16 pp.13-17 |
| EMCJ | 2020-07-02 15:20 |
Online | Online | Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2020-15 |
The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the dev... [more] | EMCJ2020-15 pp.25-28 |
| ISEC, SITE, ICSS, EMM, HWS, BioX, IPSJ-CSEC, IPSJ-SPT [detail] | 2019-07-24 09:55 |
Kochi | Kochi University of Technology | Fundamental Study on an Estimation Method of Irradiate Frequencies to Forcibly Cause Electromagnetic Information Leakage Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43 |
The threats of electromagnetic (EM) information leakage from the input/output (I/O) signal of an IC mounted on a de-vice... [more] | ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43 pp.235-238 |
| EMCJ | 2019-07-18 13:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fundamental study on influence of intentional electromagnetic interference on IC communication Hikaru Nishiyama, Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2019-23 |
Low-Power Intentional Electromagnetic Interference (IEMI) has been reported, which causes malfunction without damaging t... [more] | EMCJ2019-23 pp.29-33 |
| EMCJ, IEE-EMC, IEE-MAG | 2018-11-22 15:10 |
Overseas | KAIST | [Poster Presentation]
Fundamental Study on Degradation of Randomness in TRNG Due to Intentional Electromagnetic Interference Saki Osuka, Daisuke Fujimoto (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven), Yu-ichi Hayashi (NAIST) EMCJ2018-66 |
Attacks that degrade the randomness of a true random number generator (TRNG) by physical attacks on entropy sources, whi... [more] | EMCJ2018-66 pp.35-36 |
| EMCJ, IEE-EMC, IEE-MAG | 2018-11-22 15:10 |
Overseas | KAIST | [Poster Presentation]
Influence of IEMI considering injected signal phase on faulty outputs in a cryptographic module Mitsuki Takenouchi (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-79 |
In a fault injection method based on Intentional Electromagnetic Interference (IEMI) from a power line, the phase of the... [more] | EMCJ2018-79 pp.61-62 |
| EMCJ | 2018-07-27 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fundamental Study on Data Injection Attacks Using a Hardware Trojan against ICT Devices Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-30 |
Intentional electromagnetic interference (IEMI) is a threat to destroy integrated circuits (ICs) or elements by using hi... [more] | EMCJ2018-30 pp.49-54 |
| HWS, ISEC, SITE, ICSS, EMM, IPSJ-CSEC, IPSJ-SPT [detail] | 2018-07-25 14:25 |
Hokkaido | Sapporo Convention Center | Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven) ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19 |
Fault injection attacks using intentional electromagnetic interference against cryptographic devices have been reported.... [more] | ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19 pp.77-81 |
| EMCJ | 2017-11-22 14:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Study on the Effect of Clock Rise Time on Fault Occurrence under IEMI Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-71 |
The intentional electromagnetic interference (IEMI) fault-injection method generates a fault by injecting a glitch into ... [more] | EMCJ2017-71 pp.41-44 |
| EMCJ, IEE-EMC, IEE-MAG | 2016-06-02 13:33 |
Overseas | NTU, Taiwan | [Poster Presentation]
Study on Fault Sensitivity Analysis of Cryptographic Device under IEMI Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2016-43 |
The existing intentional electromagnetic interference (IEMI) fault injection method based on continuous sinusoidal waves... [more] | EMCJ2016-43 pp.83-84 |
| EMCJ, WPT (Joint) |
2015-01-23 15:50 |
Okinawa | Okinawaken Ｊichikaikan | Study on detection method for clock error due to intentional electromagnetic interference Atsushi Nagao, Yuichiro Okugawa, Kazuhiro Takaya (NTT), Yu-ichi Hayashi, Naofumi Homma, Takafumi Aoki (Tohoku Univ.) EMCJ2014-100 |
Overclocking, which occurs because of the disruption of the clock frequency, causes LSI modules to malfunction. The Elec... [more] | EMCJ2014-100 pp.83-88 |
| EMCJ, IEE-EMC, MW, EST [detail] | 2014-10-23 10:25 |
Akita | Akita Prefectural Univ. | Effect of Precisely Timed Intentional Electromagnetic Interference on Internal Operation in Cryptographic Device Mizuki Kobayashi, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-46 MW2014-102 EST2014-60 |
This paper presents a new intentional electromagnetic interference (IEMI) fault-injection method that can inject transie... [more] | EMCJ2014-46 MW2014-102 EST2014-60 pp.11-15 |
| EMCJ | 2014-07-10 15:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Feasibility of Fault-injected Timing Identification for Actual Cryptographic Devices Using Side-channel Information Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-23 |
The intentional electromagnetic interference (IEMI) fault-injection method using continuous sine waves causes random-byt... [more] | EMCJ2014-23 pp.37-42 |
| EMCJ, IEE-EMC | 2014-06-20 11:00 |
Hyogo | Kobe Univ. | Identification Method of Fault-injected Timing on Cryptographic Devices Using Side-channel Information Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-11 |
This paper describes a new technique to choose faulty ciphertexts available for Differential Fault Analysis (DFA) from t... [more] | EMCJ2014-11 pp.7-12 |
| EMCJ, IEE-EMC, MW, EST [detail] | 2013-10-25 17:05 |
Miyagi | Tohoku Univ. | Fundamental Study on a Mechanism of Non-invasive Fault-injection at Arbitrary Timing of Cryptographic Processing Mizuki Kobayashi, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2013-90 MW2013-130 EST2013-82 |
In this paper, we introduce a new type of intentional electromagnetic interference (IEMI) fault-injection method with ti... [more] | EMCJ2013-90 MW2013-130 EST2013-82 pp.175-179 |
| EMCJ | 2010-01-21 10:00 |
Okinawa | University of the Ryukyus | Study on Impulse Radiation System Hidenori Sekiguchi, Shinji Seto (NICT) EMCJ2009-99 |
The security of electronic equipments is concerned by intentional electromagnetic interference (IEMI), because the elect... [more] | EMCJ2009-99 pp.7-12 |
| EMCJ | 2008-09-26 14:30 |
Osaka | Osaka Univ. | A Discussion about the Malfunction and the Electromagnetic Immunity of an Information Technology Equipment under HPEM environments Hidenori Sekiguchi, Shinji Seto (NICT), Ikuya Minematsu (KEC) EMCJ2008-53 |
Electromagnetic disturbances might cause information technology equipments (ITEs) to malfunction and to be broken down. ... [more] | EMCJ2008-53 pp.19-24 |
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