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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 1053  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
MW, WPT 2024-04-18
15:50
Kanagawa Kanagawa University
(Primary: On-site, Secondary: Online)
[Invited Talk] Millimeter 5G Transceivers Using Wireless Power Transfer
Atsushi Shirane (Tokyo Tech) WPT2024-7 MW2024-7
(To be available after the conference date) [more] WPT2024-7 MW2024-7
pp.30-31
SIP, SP, EA, IPSJ-SLP [detail] 2024-03-01
09:30
Okinawa
(Primary: On-site, Secondary: Online)
SELECTING N-LOWEST SCORES FOR TRAINING MOS PREDICTION MODELS
Yuto Kondo, Hirokazu Kameoka, Kou Tanaka, Takuhiro Kaneko (NTT) EA2023-94 SIP2023-141 SP2023-76
Automatic speech quality assessment (SQA) is a task to evaluate the quality of speech samples without resorting to time-... [more] EA2023-94 SIP2023-141 SP2023-76
pp.196-201
SDM 2024-02-21
10:45
Tokyo Tokyo University-Hongo-Engineering Bldg.4
(Primary: On-site, Secondary: Online)
[Invited Talk] Development of Superconducting Nb Interconnects for Low-Temperature SoC for Qubit Control
Hideaki Numata, Noriyuki Iguchi (NBS), Masamitsu Tanaka (Nagoya Univ.), Koichiro Okamoto, Sadahiko Miura (NBS), Ken Uchida (UTokyo), Hiroki Ishikuro (Keio Univ.), Toshitsugu Sakamoto, Munehiro Tada (NBS) SDM2023-82
A 100 nm wide superconducting Nb interconnects were fabricated by a 300-mm wafer process for low temperature SoC applica... [more] SDM2023-82
pp.4-8
SDM 2024-01-31
12:35
Tokyo KIT Toranomon Graduate School
(Primary: On-site, Secondary: Online)
[Invited Talk] Milli-Kelvin Analysis Revealing the Role of Band-edge States in Cryogenic MOSFETs
Hiroshi Oka, Hidehiro Asai, Takumi Inaba, Shunsuke Shitakata, Hitoshi Yui, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Takashi Nakayama, Takahiro Mori (AIST) SDM2023-74
Toward large-scale quantum computers, cryogenic CMOS circuits have been developed to control and readout the qubits insi... [more] SDM2023-74
pp.1-4
SDM 2024-01-31
13:05
Tokyo KIT Toranomon Graduate School
(Primary: On-site, Secondary: Online)
[Invited Talk] Polarization Engineering in AlSiO/p-type GaN MOSFETs Using AlN Interlayers Formed by Plasma-Enhanced Atomic Layer Deposition
Kenji Ito, Tetsuo Narita, Hiroko Iguchi, Shiro Iwasaki, Daigo Kikuta (Toyota Central R&D), Emi Kano, Nobuyuki Ikarashi, Kazuyoshi Tomita, Masahiro Horita, Jun Suda (Nagoya Univ.) SDM2023-75
Polarization engineering by AlN interlayers (AlN-ILs) deposited via plasma-enhanced atomic layer deposition was demonstr... [more] SDM2023-75
pp.5-8
ED, MW 2024-01-25
15:30
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
Electron State Analysis under Al2O3 Gate Oxide film in EID AlGaN/GaN MOS-HEMT
Takuma Nanjo, Akira Kiyoi, Takashi Imazawa, Masayuki Furuhashi, Kazuyasu Nishikawa (Mitsubishi Electric), Takashi Egawa (Nagoya Inst. of Tech) ED2023-68 MW2023-160
(To be available after the conference date) [more] ED2023-68 MW2023-160
pp.11-14
ICTSSL, CAS 2024-01-25
13:15
Kanagawa
(Primary: On-site, Secondary: Online)
[Invited Talk] Integrated circuits and digital calibration for high-speed high-resolution low-power A/D converters
Takashi Oshima (Hitachi) CAS2023-89 ICTSSL2023-42
Given rapid advance of AI, acquisition of high-quality digital data from analog sensor signals is crucial than ever. A h... [more] CAS2023-89 ICTSSL2023-42
pp.34-39
SANE 2023-12-07
15:50
Overseas Surakarta, Indonesia
(Primary: On-site, Secondary: Online)
Retrieving Aerosol Optical Thickness using Sunphotometer and Himawari-8 Satellite
Jamrud Aminuddin, R. Farzand Abdullatif, Mashuri (UNSOED), Laras Toersilowati, Ginaldi Ari Nugroho (BRIN)
A new monitoring technique to obtain the AOT has been developed by concurrent observation of the sunphotometer and Himaw... [more]
NLP 2023-11-28
10:25
Okinawa Nago city commerce and industry association
Yusuke Goto (Chukyo Univ.), Hiroyuki Asahara (Okayama Univ. of Science), Takuji Kousaka (Chukyo Univ.), Daisuke Ito (Gifu Univ.) NLP2023-60
(To be available after the conference date) [more] NLP2023-60
pp.7-10
PEM
(Workshop)
2023-11-27
- 2023-11-28
Hokkaido Hokkaido Univ. Frontier Research in Applied Sciences Building 36-GHz electric field imaging using an electro-optic imaging system based on polarization CMOS image sensor
Ryoma Okada (NAIST), Maya Mizuno (NICT), Hironari Takehara (NAIST), Makito Haruta (NAIST/Chitose Inst. Sci. Tech.), Hiroyuki Tashiro (NAIST/Kyushu Univ.), Jun Ohta, Kiyotaka Sasagawa (NAIST)
In this study, we developed an imaging system that can detect polarization modulation with high sensitivity and demonstr... [more]
SRW, SeMI
(Joint)
2023-11-21
17:00
Tokyo Koganei Campus, Tokyo University of Agriculture and Technology
(Primary: On-site, Secondary: Online)
[Poster Presentation] Estimating the Indoor Atmosphere in the Smart Home
Aiko Hosokawa, Karen Takahasi, Kentarou Saito (TDU) SRW2023-33
Thanks to Information Technology (IT), there is a concept of Smart Homes designed to provide a comfortable living enviro... [more] SRW2023-33
p.30
MW 2023-11-16
11:15
Okinawa Nago City Industrial Support Center (Okinawa)
(Primary: On-site, Secondary: Online)
Dual-Band Asymmetric Doherty Amplifier with T-shaped Stubs
Yuki Takagi, Yoshichika Ohta (SB) MW2023-127
In this paper, we propose a design method for a dual-band asymmetric Doherty amplifier at 1.8 GHz(Band3)/2.1 GHz (Band1)... [more] MW2023-127
pp.7-12
AP, RCS
(Joint)
2023-11-16
10:35
Kumamoto Kumamoto Prefectural Workers' Welfare Hall
(Primary: On-site, Secondary: Online)
[Invited Lecture] A 2D Beam-Steerable 252-285-GHz 25.8-Gbit/s CMOS Receiver Module
Takeshi Yoshida (Hiroshima Univ.), Shinsuke Hara, Tatsuo Hagino, Mohamed Mubarak, Akifumi Kasamatsu (NICT), Kyoya Takano (Tokyo Univ. of Science), Yoshiki Sugimoto, Kunio Sakakibara (Nagoya Inst. of Tech.), Shuhei Amakawa, Minoru Fujishima (Hiroshima Univ.) AP2023-142 RCS2023-165
Recently, there have been many reports on sub-THz transmitters (TX) and receivers (RX) for high-speed wireless communica... [more] AP2023-142 RCS2023-165
p.66(AP), p.70(RCS)
SDM 2023-11-09
11:20
Tokyo
(Primary: On-site, Secondary: Online)
[Invited Talk] Current Status and Future Prospects of GaN Vertical Power Devices on GaN substrates
Jun Suda (Nagoya Univ.) SDM2023-63
Recent progress of GaN vertical power devices which fabricated on n-type GaN bulk substates. Fundamental properties of ... [more] SDM2023-63
p.7
SDM 2023-11-10
13:10
Tokyo
(Primary: On-site, Secondary: Online)
[Invited Talk] Noies Source of MOSFETs Operating at Cryogenic Temperature
Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori (AIST) SDM2023-70
There is increasing demand for the development of classic integrated circuits to control qubits for quantum computers. F... [more] SDM2023-70
p.35
SDM 2023-11-10
15:30
Tokyo
(Primary: On-site, Secondary: Online)
[Invited Talk] DFT study on electronic structure and carrier-transport property of SiC-MOS interface.
Tomoya Ono (Kobe Univ.) SDM2023-73
Density functional theory calculations for investigation of electronic structure and charrier scattering property of the... [more] SDM2023-73
pp.47-50
ICD, HWS 2023-10-31
15:00
Mie  
(Primary: On-site, Secondary: Online)
Side-Channel Leakage Evaluation of 3D CMOS Chip Stacking
Kazuki Monta, Rikuu Hasegawa, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-57 ICD2023-36
2.5D and 3D packaging are methodologies that include multiple integrated circuit (IC) chips. They deliver enhanced perfo... [more] HWS2023-57 ICD2023-36
pp.16-19
NC, MBE
(Joint)
2023-10-28
10:45
Miyagi Tohoku Univ.
(Primary: On-site, Secondary: Online)
A design of ultra-low power reservoir computing system with analog CMOS spiking neural network circuits
Satoshi Ono, Satoshi Moriya, Hideaki Yamamoto (Tohoku Univ.), Yasushi Yuminaka (Gunma Univ.), Yoshihiko Horio, Shigeo Sato (Tohoku Univ.) NC2023-29
Spiking neural network (SNN) is expected to be applied to edge computing due to its low power consumption when implement... [more] NC2023-29
p.23
SDM 2023-10-13
15:10
Miyagi Niche, Tohoku Univ. [Invited Talk] statistical analysis of random telegraphic noise dependence on operating condition using electrical characteristic measurement platform
Takezo Mawaki, Rihito Kuroda (Tohoku Univ.) SDM2023-57
We refer to the overall measurement system composed of array test circuits and other equipment as the electrical charact... [more] SDM2023-57
pp.21-26
SDM 2023-10-13
16:40
Miyagi Niche, Tohoku Univ. Formation process of GaN MOS interface suppressing interfacial oxidation
Tsurugi Kondo, Katsunori Ueno, Ryo Tanaka, Shinya Takashima, Masaharu Edo (Fuji Electric), Tomoyuki Suwa (NICHe, Tohoku Univ.) SDM2023-60
In this paper, we report the effects of MOS interfacial oxidation on electrical properties of GaN MOSFET and show improv... [more] SDM2023-60
pp.40-45
 Results 1 - 20 of 1053  /  [Next]  
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