Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
MW, WPT |
2024-04-18 15:50 |
Kanagawa |
Kanagawa University (Primary: On-site, Secondary: Online) |
[Invited Talk]
Millimeter 5G Transceivers Using Wireless Power Transfer Atsushi Shirane (Tokyo Tech) WPT2024-7 MW2024-7 |
(To be available after the conference date) [more] |
WPT2024-7 MW2024-7 pp.30-31 |
SIP, SP, EA, IPSJ-SLP [detail] |
2024-03-01 09:30 |
Okinawa |
(Primary: On-site, Secondary: Online) |
SELECTING N-LOWEST SCORES FOR TRAINING MOS PREDICTION MODELS Yuto Kondo, Hirokazu Kameoka, Kou Tanaka, Takuhiro Kaneko (NTT) EA2023-94 SIP2023-141 SP2023-76 |
Automatic speech quality assessment (SQA) is a task to evaluate the quality of speech samples without resorting to time-... [more] |
EA2023-94 SIP2023-141 SP2023-76 pp.196-201 |
SDM |
2024-02-21 10:45 |
Tokyo |
Tokyo University-Hongo-Engineering Bldg.4 (Primary: On-site, Secondary: Online) |
[Invited Talk]
Development of Superconducting Nb Interconnects for Low-Temperature SoC for Qubit Control Hideaki Numata, Noriyuki Iguchi (NBS), Masamitsu Tanaka (Nagoya Univ.), Koichiro Okamoto, Sadahiko Miura (NBS), Ken Uchida (UTokyo), Hiroki Ishikuro (Keio Univ.), Toshitsugu Sakamoto, Munehiro Tada (NBS) SDM2023-82 |
A 100 nm wide superconducting Nb interconnects were fabricated by a 300-mm wafer process for low temperature SoC applica... [more] |
SDM2023-82 pp.4-8 |
SDM |
2024-01-31 12:35 |
Tokyo |
KIT Toranomon Graduate School (Primary: On-site, Secondary: Online) |
[Invited Talk]
Milli-Kelvin Analysis Revealing the Role of Band-edge States in Cryogenic MOSFETs Hiroshi Oka, Hidehiro Asai, Takumi Inaba, Shunsuke Shitakata, Hitoshi Yui, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Takashi Nakayama, Takahiro Mori (AIST) SDM2023-74 |
Toward large-scale quantum computers, cryogenic CMOS circuits have been developed to control and readout the qubits insi... [more] |
SDM2023-74 pp.1-4 |
SDM |
2024-01-31 13:05 |
Tokyo |
KIT Toranomon Graduate School (Primary: On-site, Secondary: Online) |
[Invited Talk]
Polarization Engineering in AlSiO/p-type GaN MOSFETs Using AlN Interlayers Formed by Plasma-Enhanced Atomic Layer Deposition Kenji Ito, Tetsuo Narita, Hiroko Iguchi, Shiro Iwasaki, Daigo Kikuta (Toyota Central R&D), Emi Kano, Nobuyuki Ikarashi, Kazuyoshi Tomita, Masahiro Horita, Jun Suda (Nagoya Univ.) SDM2023-75 |
Polarization engineering by AlN interlayers (AlN-ILs) deposited via plasma-enhanced atomic layer deposition was demonstr... [more] |
SDM2023-75 pp.5-8 |
ED, MW |
2024-01-25 15:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Electron State Analysis under Al2O3 Gate Oxide film in EID AlGaN/GaN MOS-HEMT Takuma Nanjo, Akira Kiyoi, Takashi Imazawa, Masayuki Furuhashi, Kazuyasu Nishikawa (Mitsubishi Electric), Takashi Egawa (Nagoya Inst. of Tech) ED2023-68 MW2023-160 |
(To be available after the conference date) [more] |
ED2023-68 MW2023-160 pp.11-14 |
ICTSSL, CAS |
2024-01-25 13:15 |
Kanagawa |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
Integrated circuits and digital calibration for high-speed high-resolution low-power A/D converters Takashi Oshima (Hitachi) CAS2023-89 ICTSSL2023-42 |
Given rapid advance of AI, acquisition of high-quality digital data from analog sensor signals is crucial than ever. A h... [more] |
CAS2023-89 ICTSSL2023-42 pp.34-39 |
SANE |
2023-12-07 15:50 |
Overseas |
Surakarta, Indonesia (Primary: On-site, Secondary: Online) |
Retrieving Aerosol Optical Thickness using Sunphotometer and Himawari-8 Satellite Jamrud Aminuddin, R. Farzand Abdullatif, Mashuri (UNSOED), Laras Toersilowati, Ginaldi Ari Nugroho (BRIN) |
A new monitoring technique to obtain the AOT has been developed by concurrent observation of the sunphotometer and Himaw... [more] |
|
NLP |
2023-11-28 10:25 |
Okinawa |
Nago city commerce and industry association |
Yusuke Goto (Chukyo Univ.), Hiroyuki Asahara (Okayama Univ. of Science), Takuji Kousaka (Chukyo Univ.), Daisuke Ito (Gifu Univ.) NLP2023-60 |
(To be available after the conference date) [more] |
NLP2023-60 pp.7-10 |
PEM (Workshop) |
2023-11-27 - 2023-11-28 |
Hokkaido |
Hokkaido Univ. Frontier Research in Applied Sciences Building |
36-GHz electric field imaging using an electro-optic imaging system based on polarization CMOS image sensor Ryoma Okada (NAIST), Maya Mizuno (NICT), Hironari Takehara (NAIST), Makito Haruta (NAIST/Chitose Inst. Sci. Tech.), Hiroyuki Tashiro (NAIST/Kyushu Univ.), Jun Ohta, Kiyotaka Sasagawa (NAIST) |
In this study, we developed an imaging system that can detect polarization modulation with high sensitivity and demonstr... [more] |
|
SRW, SeMI (Joint) |
2023-11-21 17:00 |
Tokyo |
Koganei Campus, Tokyo University of Agriculture and Technology (Primary: On-site, Secondary: Online) |
[Poster Presentation]
Estimating the Indoor Atmosphere in the Smart Home Aiko Hosokawa, Karen Takahasi, Kentarou Saito (TDU) SRW2023-33 |
Thanks to Information Technology (IT), there is a concept of Smart Homes designed to provide a comfortable living enviro... [more] |
SRW2023-33 p.30 |
MW |
2023-11-16 11:15 |
Okinawa |
Nago City Industrial Support Center (Okinawa) (Primary: On-site, Secondary: Online) |
Dual-Band Asymmetric Doherty Amplifier with T-shaped Stubs Yuki Takagi, Yoshichika Ohta (SB) MW2023-127 |
In this paper, we propose a design method for a dual-band asymmetric Doherty amplifier at 1.8 GHz(Band3)/2.1 GHz (Band1)... [more] |
MW2023-127 pp.7-12 |
AP, RCS (Joint) |
2023-11-16 10:35 |
Kumamoto |
Kumamoto Prefectural Workers' Welfare Hall (Primary: On-site, Secondary: Online) |
[Invited Lecture]
A 2D Beam-Steerable 252-285-GHz 25.8-Gbit/s CMOS Receiver Module Takeshi Yoshida (Hiroshima Univ.), Shinsuke Hara, Tatsuo Hagino, Mohamed Mubarak, Akifumi Kasamatsu (NICT), Kyoya Takano (Tokyo Univ. of Science), Yoshiki Sugimoto, Kunio Sakakibara (Nagoya Inst. of Tech.), Shuhei Amakawa, Minoru Fujishima (Hiroshima Univ.) AP2023-142 RCS2023-165 |
Recently, there have been many reports on sub-THz transmitters (TX) and receivers (RX) for high-speed wireless communica... [more] |
AP2023-142 RCS2023-165 p.66(AP), p.70(RCS) |
SDM |
2023-11-09 11:20 |
Tokyo |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
Current Status and Future Prospects of GaN Vertical Power Devices on GaN substrates Jun Suda (Nagoya Univ.) SDM2023-63 |
Recent progress of GaN vertical power devices which fabricated on n-type GaN bulk substates. Fundamental properties of ... [more] |
SDM2023-63 p.7 |
SDM |
2023-11-10 13:10 |
Tokyo |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
Noies Source of MOSFETs Operating at Cryogenic Temperature Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori (AIST) SDM2023-70 |
There is increasing demand for the development of classic integrated circuits to control qubits for quantum computers. F... [more] |
SDM2023-70 p.35 |
SDM |
2023-11-10 15:30 |
Tokyo |
(Primary: On-site, Secondary: Online) |
[Invited Talk]
DFT study on electronic structure and carrier-transport property of SiC-MOS interface. Tomoya Ono (Kobe Univ.) SDM2023-73 |
Density functional theory calculations for investigation of electronic structure and charrier scattering property of the... [more] |
SDM2023-73 pp.47-50 |
ICD, HWS |
2023-10-31 15:00 |
Mie |
(Primary: On-site, Secondary: Online) |
Side-Channel Leakage Evaluation of 3D CMOS Chip Stacking Kazuki Monta, Rikuu Hasegawa, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-57 ICD2023-36 |
2.5D and 3D packaging are methodologies that include multiple integrated circuit (IC) chips. They deliver enhanced perfo... [more] |
HWS2023-57 ICD2023-36 pp.16-19 |
NC, MBE (Joint) |
2023-10-28 10:45 |
Miyagi |
Tohoku Univ. (Primary: On-site, Secondary: Online) |
A design of ultra-low power reservoir computing system with analog CMOS spiking neural network circuits Satoshi Ono, Satoshi Moriya, Hideaki Yamamoto (Tohoku Univ.), Yasushi Yuminaka (Gunma Univ.), Yoshihiko Horio, Shigeo Sato (Tohoku Univ.) NC2023-29 |
Spiking neural network (SNN) is expected to be applied to edge computing due to its low power consumption when implement... [more] |
NC2023-29 p.23 |
SDM |
2023-10-13 15:10 |
Miyagi |
Niche, Tohoku Univ. |
[Invited Talk]
statistical analysis of random telegraphic noise dependence on operating condition using electrical characteristic measurement platform Takezo Mawaki, Rihito Kuroda (Tohoku Univ.) SDM2023-57 |
We refer to the overall measurement system composed of array test circuits and other equipment as the electrical charact... [more] |
SDM2023-57 pp.21-26 |
SDM |
2023-10-13 16:40 |
Miyagi |
Niche, Tohoku Univ. |
Formation process of GaN MOS interface suppressing interfacial oxidation Tsurugi Kondo, Katsunori Ueno, Ryo Tanaka, Shinya Takashima, Masaharu Edo (Fuji Electric), Tomoyuki Suwa (NICHe, Tohoku Univ.) SDM2023-60 |
In this paper, we report the effects of MOS interfacial oxidation on electrical properties of GaN MOSFET and show improv... [more] |
SDM2023-60 pp.40-45 |