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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2012-11-26
16:00		 Fukuoka Centennial Hall Kyushu University School of Medicine Impact of Body-Biasing Technique on RTN-induced Delay Fluctuation
Takashi Matsumoto (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) VLD2012-70 DC2012-36		 Designing reliable systems has become more difficult in recent years.
In this paper, statistical nature of RTN-induced ... [more]		 VLD2012-70 DC2012-36
pp.63-68
VLD 2012-03-07
09:40		 Oita B-con Plaza Design automation of highly reliable VLSI by redundancy FF replacement method
Ken Yano, Takahito Yoshiki, Takanori Hayashida, Toshinori Sato (Fukuokadai) VLD2011-133		 Design automation of highly reliable VLSI using canary FF is proposed. Canary FF is used to detect timing error caused f... [more] VLD2011-133
pp.79-84
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2011-11-29
15:05		 Miyazaki NewWelCity Miyazaki Multi-core LSI Lifetime Extension by NBTI-Recovery-based Self-healing
Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) CPM2011-160 ICD2011-92		 Designing reliable systrems has become more difficult in recent years. Negative-Bias-Temperature-In-stability (NBTI) is ... [more] CPM2011-160 ICD2011-92
pp.59-63
ICD 2010-12-16
15:10		 Tokyo RCAST, Univ. of Tokyo [Poster Presentation] A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor
Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) ICD2010-104		 We proposed an NBTI-recovery sensor with 400ns measurement delay. This sensor contains many unit cells. One unit cell in... [more] ICD2010-104
pp.55-58
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