Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED |
2019-04-18 13:25 |
Miyagi |
RIEC, Tohoku Univ. |
Characteristic evaluation of ZnO thin film deposit by room temperature ALD Kazuki Yoshida, Kentaro Saito, Masanori Miura, Kensaku Kanomata, Fumihiko Hirose (Yamagata Univ.) ED2019-2 |
(To be available after the conference date) [more] |
ED2019-2 pp.5-8 |
EID, ITE-IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] |
2019-01-25 11:00 |
Kagoshima |
Kagoshima University |
[Poster Presentation]
Improved Flexoelectric Coefficient Measurement by Means of Transmission Ellipsometry Takashi Onishi, Munehiro Kimura (NUT) EID2018-18 |
In nematic liquid crystal (NLC), the electrical polarization effect which is called flexoelectricity occurs under splay ... [more] |
EID2018-18 pp.117-120 |
EID, ITE-IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] |
2019-01-25 11:05 |
Kagoshima |
Kagoshima University |
[Poster Presentation]
Measurement of dependence of UV irradiation energy on azimuthal and polar anchoring energy for photo alignment film Kenya Saito, Munehiro Kimura (Nagaoka Univ. of Tech.) EID2018-19 |
The surface anchoring energy is an index representing the strength of the alignment restoring force.
Hence it is an imp... [more] |
EID2018-19 pp.121-124 |
CPM, LQE, ED |
2016-12-13 14:40 |
Kyoto |
Kyoto University |
Characterization of electric properties for wide-gap semiconductors using terahertz time-domain elipsometry Takashi Fujii (RITS/PNP), Kohei Tachi, Tsutomu Araki, Yasushi Nanishi (RITS), Toshiyuki Iwamoto, Yukinori Sato (PNP), Takshi Nagashima (Setsunan Univ.) ED2016-78 CPM2016-111 LQE2016-94 |
Scattering time () of several inorganic semiconductors are around 10-1 psec. Therefore, electric properties, suc... [more] |
ED2016-78 CPM2016-111 LQE2016-94 pp.103-106 |
SDM |
2016-01-22 11:35 |
Tokyo |
Sanjo Conference Hall, The University of Tokyo |
In-situ ellipsometry of Cu surfaces immersed in BTA-H2O2 solutions Tatsuya Kawakami, Eiichi Kondoh, Mitsuhiro Watanabe (University of Yamanashi), Satomi Hamada, Shohei Shima, Hirokuni Hiyama (Ebara Corporation) SDM2015-111 |
During Cu CMP, Cu surface is oxidized by an oxidizer or a complexiation reagent. To inhibit oxidation, a corrosion inhib... [more] |
SDM2015-111 pp.13-15 |
SDM, EID |
2014-12-12 11:00 |
Kyoto |
Kyoto University |
Irradiation Effect of Carbon-Based Polyatomic Ions on Si Substrate Mitsuaki Takeuchi, Kyohei Hayashi, Hiromichi Ryuto, Gikan H. Takaoka (Kyoto Univ.), Tsutomu Nagayama, Koji Matsuda (Nissin Ion Equipment) EID2014-17 SDM2014-112 |
Irradiation damage on Si(100) substrates which were irradiated with C$_{n}$H$_{n}^{+}$($n$=3, 7, 14) and C$_{n}$H$_{2n+1... [more] |
EID2014-17 SDM2014-112 pp.21-24 |
OME, IEE-DEI |
2014-07-10 16:40 |
Nagano |
|
Transmission ellipsometric method without an aperture for simple and reliable evaluation of electro-optic coefficients of electro-optic polymers Toshiki Yamada, Akira Otomo (NICT) OME2014-35 |
Recently, considerable attention has been paid to the development of polymeric electro-optic (EO) materials due to their... [more] |
OME2014-35 pp.39-44 |
EID, ITE-IDY, IEIJ-SSL, IEE-EDD, SID-JC [detail] |
2014-01-25 11:22 |
Niigata |
Niigata University |
Evaluation of flexoelectric coefficients by using the SOITE method Taiki Watanabe (Nagaoka Univ. of Tech.), Taiju Takahashi (Kougakuin Univ.), Munehiro Kimura, Tadashi Akahane (Nagaoka Univ. of Tech.) EID2013-31 |
It is well known that the electric polarization arises from the bend or spray distortion of the orientation. This phenom... [more] |
EID2013-31 pp.125-128 |
OME |
2011-12-21 13:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Real Time Monitoring of the Surface Reaction During the Growth of Organic Thin-Films by Elecrospray Deposition Method Taiga Hiate, Tomohisa Ino, Takeshi Fukuda, Keiji Ueno, Hajime Shirai (Saitama Univ.) OME2011-68 |
Electrospray-deposited (ESD) Poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) was investigated using ... [more] |
OME2011-68 pp.11-16 |
CPM |
2010-07-29 15:50 |
Hokkaido |
Michino-Eki Shari Meeting Room |
[Invited Talk]
Science in porosity engineering of low-k dielectrics using supercritical carbon dioxide
-- Pore characterization and pore cleaning -- Eiichi Kondoh (Univ. of Yamanashi.) CPM2010-35 |
Supercritical carbon dioxide possesses nano-penetration ability, zero surface tension and solvent capability. These prop... [more] |
CPM2010-35 pp.23-28 |
ED |
2010-04-22 10:50 |
Yamagata |
|
Molecular orientation in amorphous films and device characteristics of OLEDs Daisuke Yokoyama (Yamagata Univ.), Chihaya Adachi (Kyushu Univ.), Junji Kido (Yamagata Univ.) ED2010-3 |
The authors demonstrate the effects of molecular orientation on the electrical characteristics of OLEDs, where organic a... [more] |
ED2010-3 pp.7-10 |
EMD, R |
2010-02-19 15:45 |
Osaka |
|
Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) R2009-57 EMD2009-124 |
Tin plated surface used for contact surface such as connectors is usually covered with the oxide vfilm in the atmosphere... [more] |
R2009-57 EMD2009-124 pp.43-48 |
EMD |
2009-11-20 14:50 |
Tokyo |
Nippon Institute of Technology, Kanda Campus, Tokyo, Japan |
Growth of oxide film on tin plated surface of connector contacts and it effect on contact resistance Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (ANTech), Terutaka Tamai (Mie Univ.) EMD2009-100 |
Tin plating has been applied widely to electrical connector contacts to save the cost. However, the tin plated surfaces ... [more] |
EMD2009-100 pp.133-136 |
OME, EID |
2009-03-06 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
- Daisuke Yokoyama (Kyushu Univ.), Akio Sakaguchi, Michio Suzuki (J. A. Woollam Co., Inc), Chihaya Adachi (Kyushu Univ.) EID2008-88 OME2008-99 |
It has been taken for granted that molecules in organic vacuum-deposited amorphous films are randomly oriented and the f... [more] |
EID2008-88 OME2008-99 pp.27-32 |
EMD |
2009-03-06 16:35 |
Tokyo |
Kougakuin Univ. |
Growth Law of the Oxide Film Formed on the Tin Plated Contact Surface and Its Contact Resistance Characteristic
-- Ellipsometric Study -- Yuya Nabeta, Terutaka Tamai, Yasushi Saitoh, Shigeru Sawada, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AN Technorogies) EMD2008-146 |
Tin plated contacts has been applied widely to electrical contacts of electromechanical devices as well as gold plated c... [more] |
EMD2008-146 pp.49-52 |
ED, SDM |
2007-06-25 17:10 |
Overseas |
Commodore Hotel Gyeongju Chosun, Gyeongju, Korea |
Efficient Activation of Dopant in Poly-Si film using Excimer Laser Annealing Takashi Noguchi (University of the Ryukyus) |
Efficient activation of doped Si film using low temperature process is important to realize a high performance Si TFT. D... [more] |
|