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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 16 of 16  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ED 2019-04-18
13:25
Miyagi RIEC, Tohoku Univ. Characteristic evaluation of ZnO thin film deposit by room temperature ALD
Kazuki Yoshida, Kentaro Saito, Masanori Miura, Kensaku Kanomata, Fumihiko Hirose (Yamagata Univ.) ED2019-2
(To be available after the conference date) [more] ED2019-2
pp.5-8
EID, ITE-IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] 2019-01-25
11:00
Kagoshima Kagoshima University [Poster Presentation] Improved Flexoelectric Coefficient Measurement by Means of Transmission Ellipsometry
Takashi Onishi, Munehiro Kimura (NUT) EID2018-18
In nematic liquid crystal (NLC), the electrical polarization effect which is called flexoelectricity occurs under splay ... [more] EID2018-18
pp.117-120
EID, ITE-IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] 2019-01-25
11:05
Kagoshima Kagoshima University [Poster Presentation] Measurement of dependence of UV irradiation energy on azimuthal and polar anchoring energy for photo alignment film
Kenya Saito, Munehiro Kimura (Nagaoka Univ. of Tech.) EID2018-19
The surface anchoring energy is an index representing the strength of the alignment restoring force.
Hence it is an imp... [more]
EID2018-19
pp.121-124
CPM, LQE, ED 2016-12-13
14:40
Kyoto Kyoto University Characterization of electric properties for wide-gap semiconductors using terahertz time-domain elipsometry
Takashi Fujii (RITS/PNP), Kohei Tachi, Tsutomu Araki, Yasushi Nanishi (RITS), Toshiyuki Iwamoto, Yukinori Sato (PNP), Takshi Nagashima (Setsunan Univ.) ED2016-78 CPM2016-111 LQE2016-94
Scattering time () of several inorganic semiconductors are around 10-1 psec. Therefore, electric properties, suc... [more] ED2016-78 CPM2016-111 LQE2016-94
pp.103-106
SDM 2016-01-22
11:35
Tokyo Sanjo Conference Hall, The University of Tokyo In-situ ellipsometry of Cu surfaces immersed in BTA-H2O2 solutions
Tatsuya Kawakami, Eiichi Kondoh, Mitsuhiro Watanabe (University of Yamanashi), Satomi Hamada, Shohei Shima, Hirokuni Hiyama (Ebara Corporation) SDM2015-111
During Cu CMP, Cu surface is oxidized by an oxidizer or a complexiation reagent. To inhibit oxidation, a corrosion inhib... [more] SDM2015-111
pp.13-15
SDM, EID 2014-12-12
11:00
Kyoto Kyoto University Irradiation Effect of Carbon-Based Polyatomic Ions on Si Substrate
Mitsuaki Takeuchi, Kyohei Hayashi, Hiromichi Ryuto, Gikan H. Takaoka (Kyoto Univ.), Tsutomu Nagayama, Koji Matsuda (Nissin Ion Equipment) EID2014-17 SDM2014-112
Irradiation damage on Si(100) substrates which were irradiated with C$_{n}$H$_{n}^{+}$($n$=3, 7, 14) and C$_{n}$H$_{2n+1... [more] EID2014-17 SDM2014-112
pp.21-24
OME, IEE-DEI 2014-07-10
16:40
Nagano   Transmission ellipsometric method without an aperture for simple and reliable evaluation of electro-optic coefficients of electro-optic polymers
Toshiki Yamada, Akira Otomo (NICT) OME2014-35
Recently, considerable attention has been paid to the development of polymeric electro-optic (EO) materials due to their... [more] OME2014-35
pp.39-44
EID, ITE-IDY, IEIJ-SSL, IEE-EDD, SID-JC [detail] 2014-01-25
11:22
Niigata Niigata University Evaluation of flexoelectric coefficients by using the SOITE method
Taiki Watanabe (Nagaoka Univ. of Tech.), Taiju Takahashi (Kougakuin Univ.), Munehiro Kimura, Tadashi Akahane (Nagaoka Univ. of Tech.) EID2013-31
It is well known that the electric polarization arises from the bend or spray distortion of the orientation. This phenom... [more] EID2013-31
pp.125-128
OME 2011-12-21
13:55
Tokyo Kikai-Shinko-Kaikan Bldg. Real Time Monitoring of the Surface Reaction During the Growth of Organic Thin-Films by Elecrospray Deposition Method
Taiga Hiate, Tomohisa Ino, Takeshi Fukuda, Keiji Ueno, Hajime Shirai (Saitama Univ.) OME2011-68
Electrospray-deposited (ESD) Poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) was investigated using ... [more] OME2011-68
pp.11-16
CPM 2010-07-29
15:50
Hokkaido Michino-Eki Shari Meeting Room [Invited Talk] Science in porosity engineering of low-k dielectrics using supercritical carbon dioxide -- Pore characterization and pore cleaning --
Eiichi Kondoh (Univ. of Yamanashi.) CPM2010-35
Supercritical carbon dioxide possesses nano-penetration ability, zero surface tension and solvent capability. These prop... [more] CPM2010-35
pp.23-28
ED 2010-04-22
10:50
Yamagata   Molecular orientation in amorphous films and device characteristics of OLEDs
Daisuke Yokoyama (Yamagata Univ.), Chihaya Adachi (Kyushu Univ.), Junji Kido (Yamagata Univ.) ED2010-3
The authors demonstrate the effects of molecular orientation on the electrical characteristics of OLEDs, where organic a... [more] ED2010-3
pp.7-10
EMD, R 2010-02-19
15:45
Osaka   Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance
Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) R2009-57 EMD2009-124
Tin plated surface used for contact surface such as connectors is usually covered with the oxide vfilm in the atmosphere... [more] R2009-57 EMD2009-124
pp.43-48
EMD 2009-11-20
14:50
Tokyo Nippon Institute of Technology, Kanda Campus, Tokyo, Japan Growth of oxide film on tin plated surface of connector contacts and it effect on contact resistance
Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (ANTech), Terutaka Tamai (Mie Univ.) EMD2009-100
Tin plating has been applied widely to electrical connector contacts to save the cost. However, the tin plated surfaces ... [more] EMD2009-100
pp.133-136
OME, EID 2009-03-06
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. -
Daisuke Yokoyama (Kyushu Univ.), Akio Sakaguchi, Michio Suzuki (J. A. Woollam Co., Inc), Chihaya Adachi (Kyushu Univ.) EID2008-88 OME2008-99
It has been taken for granted that molecules in organic vacuum-deposited amorphous films are randomly oriented and the f... [more] EID2008-88 OME2008-99
pp.27-32
EMD 2009-03-06
16:35
Tokyo Kougakuin Univ. Growth Law of the Oxide Film Formed on the Tin Plated Contact Surface and Its Contact Resistance Characteristic -- Ellipsometric Study --
Yuya Nabeta, Terutaka Tamai, Yasushi Saitoh, Shigeru Sawada, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AN Technorogies) EMD2008-146
Tin plated contacts has been applied widely to electrical contacts of electromechanical devices as well as gold plated c... [more] EMD2008-146
pp.49-52
ED, SDM 2007-06-25
17:10
Overseas Commodore Hotel Gyeongju Chosun, Gyeongju, Korea Efficient Activation of Dopant in Poly-Si film using Excimer Laser Annealing
Takashi Noguchi (University of the Ryukyus)
Efficient activation of doped Si film using low temperature process is important to realize a high performance Si TFT. D... [more]
 Results 1 - 16 of 16  /   
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