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Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2015-11-19
14:25
Osaka   A Measurement Method for the Extent of Simultaneous Soft Errors
Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba) R2015-57
Regarding the LSI soft error caused by the neutron beam, a single particle of neutron may cause multiple chained soft er... [more] R2015-57
pp.5-10
ICD 2012-12-18
11:45
Tokyo Tokyo Tech Front A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop
Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) ICD2012-117
We propose a low-power redundant flip-flop to be operated with high reliability over 1 GHz clock frequency based on the ... [more] ICD2012-117
pp.109-113
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