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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| BioX, ISEC, SITE, ICSS, EMM, HWS, IPSJ-CSEC, IPSJ-SPT [detail] | 2021-07-20 16:20 |
Online | Online | Implementation and Evaluation of a Ring Oscillator Type True Random Number Generator (2) Ryuichi Minagawa, KevinHideaki Omae, Kotarou Hayashi, Naoya Torii (Soka Univ.)  ISEC2021-27 SITE2021-21 BioX2021-28 HWS2021-27 ICSS2021-32 EMM2021-32 |
A true random number generator (TRNG) is suitable for securing key generation and nonce generation on IoT devices. The r... [more] | ISEC2021-27 SITE2021-21 BioX2021-28 HWS2021-27 ICSS2021-32 EMM2021-32 pp.104-109 |
| US | 2021-06-18 14:30 |
Online | Online | Construction of discrimination support system using GAN for non-destructive testing images by scanning elastic wave source technique Kyosuke Shimizu, Ayumu Osumi, Youichi Ito (Nihon Univ.) US2021-11 |
We proposed Scanning Airborne Ultrasound Source Technique (SAUA). SAUS is a detecting method of thinning defects generat... [more] | US2021-11 pp.18-22 |
| US | 2021-05-17 14:50 |
Online | Online | Visualization of guided wave propagation using scanning nonlinear elastic wave source technique with airborne ultrasound phased array Kyosuke Shimizu, Ayumu Osumi, Youichi Ito (Nihon Univ.) US2021-3 |
We aim to realize a scanning laser source technique (SLS) by using high-intensity airborne ultrasonic waves. As one of ... [more] |
US2021-3 pp.12-15 |
| ICM | 2021-03-18 09:00 |
Online | Online | Proposal of Automatic Generation Method of API Adapter Test Code Sho Kanemaru, Yukitsugu Sasaki, Kensuke Takahashi, Tsuyoshi Toyoshima (NTT) ICM2020-59 |
In B2B2X (Business to Business to X) business model, the importance of API orchestrator for constructing and operating s... [more] | ICM2020-59 pp.1-6 |
| SS | 2021-03-03 13:50 |
Online | Online | Analysis of the Impact of Automatically Generated Test Cases on the Results of Automatic Bug Repair Yuga Matsuda, Kyosuke Yamate, Yasutaka Kamei, Naoyasu Ubayashi (Kyushu Univ.) SS2020-32 |
In order to reduce debugging costs in software development, there has been a lot of research on automatic program repair... [more] | SS2020-32 pp.25-30 |
| HIP, VRSJ | 2021-02-19 16:25 |
Online | Online | Development and application of a highly sensitive color vision system Masatoshi Kitaguchi, Sayumi Tsuyuguchi, Miwa Hashizume, Ayuka Kato, Tomoyuki Naito, Hiromichi Sato (Osaka Univ.) HIP2020-91 |
Dystrophinopathy is a progressive intractable disease that is caused by an abnormality in the gene for the causative pro... [more] | HIP2020-91 pp.78-83 |
| DC | 2021-02-05 14:00 |
Online | Online | Multiple Target Test Generation Method using Test Scheduling Information of RTL Hardware Elements Ryuki Asami, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2020-74 |
In recent years, since the test cost for large-scale integrated circuits has increased, design-for-testability methods f... [more] | DC2020-74 pp.30-35 |
| DC | 2021-02-05 15:30 |
Online | Online | A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2020-77 |
A field testing that monitors the values of circuit outputs and internal signal lines during function mode is used as on... [more] | DC2020-77 pp.48-53 |
| CPSY, RECONF, VLD, IPSJ-ARC, IPSJ-SLDM [detail] | 2021-01-26 15:30 |
Online | Online | Performance Testing of VRP Optimization of C Compilers by Random Program Generation Daiki Murakami, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2020-66 CPSY2020-49 RECONF2020-85 |
This paper proposes an automated method to test if C compilers properly perform VRP optimization. The VRP optimization i... [more] | VLD2020-66 CPSY2020-49 RECONF2020-85 pp.154-159 |
| CPSY, DC, IPSJ-ARC [detail] | 2020-07-31 15:45 |
Online | Online | A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the number of Test Patterns Ryuki Asami, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2020-12 DC2020-12 |
In recent years, as the high density and complexity of integrated circuits have increased, defects in cells have increas... [more] | CPSY2020-12 DC2020-12 pp.75-80 |
| SITE, ISEC, HWS, EMM, BioX, IPSJ-CSEC, IPSJ-SPT, ICSS [detail] | 2020-07-21 10:00 |
Online | Online | Performance Evaluation of True Random Number Generator Using Latches Naoya Torii, Hideaki Kevin Omae (Soka Univ.) ISEC2020-24 SITE2020-21 BioX2020-27 HWS2020-17 ICSS2020-11 EMM2020-21 |
The use of a physical random number generator (TRNG) is suitable for secure key generation of IoT devices and secure non... [more] | ISEC2020-24 SITE2020-21 BioX2020-27 HWS2020-17 ICSS2020-11 EMM2020-21 pp.69-74 |
| NS, IN (Joint) |
2020-03-06 11:00 |
Okinawa | Royal Hotel Okinawa Zanpa-Misaki (Cancelled but technical report was issued) |
To Evaluate the Benefits of Compound Words for Determining if a Test Case is Necessary using Support Vector Machine Satoshi Sunaga, Kazuhiro Kikuma (NTT), Shota Inokoshi, Koki Sato, Kiyoshi Ueda (Nihon Univ.) NS2019-226 |
Communication software used for Next Generation Network (NGN) etc. requires high reliability and therefore adopts many... [more] |
NS2019-226 pp.271-276 |
| NS, IN (Joint) |
2020-03-06 13:00 |
Okinawa | Royal Hotel Okinawa Zanpa-Misaki (Cancelled but technical report was issued) |
Training Data Creation Method by PMI using MAP Estimation for the Automatic Test Cases Generation Koki Sato, Yuki Matsumoto (Nihon Univ.), Takeshi Yamada, Kazuhiro Kikuma (NTT Corporation), Kiyoshi Ueda (Nihon Univ.) NS2019-237 |
NGN which have of the feature both of the internet and the PSTN is required the guarantee of the safety and the social d... [more] | NS2019-237 pp.335-339 |
| HWS, VLD [detail] | 2020-03-06 14:30 |
Okinawa | Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
A Test Generation Method for Resistive Open Faults Using Partial MAX-SAT solver Hiroshi Yamazaki, Yuta Ishiyama, Tatsuma Matsuta, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2019-131 HWS2019-104 |
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] | VLD2019-131 HWS2019-104 pp.215-220 |
| RCS, SR, SRW (Joint) |
2020-03-05 15:05 |
Tokyo | Tokyo Institute of Technology (Cancelled but technical report was issued) |
[Invited Lecture]
Latest research and development status of multi-hop mesh network Wi-SUN FAN Yoshihiro Izumi (NSS) SRW2019-74 |
The latest research and development status of the multi-hop mesh network Wi-SUN FAN, which is attracting attention as th... [more] | SRW2019-74 pp.75-80 |
| DC | 2020-02-26 12:00 |
Tokyo | A controller augmentation method to reduce the number of untestable faults for multiplexers with n-inputs Yuki Takeuchi, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2019-90 |
With the complexity for VLSIs, transition fault testing is required. However, VLSIs generally have more untestable trans... [more] | DC2019-90 pp.25-30 |
|
| DC | 2020-02-26 14:10 |
Tokyo | A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92 |
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] | DC2019-92 pp.37-42 |
|
| IPSJ-SLDM, RECONF, VLD, CPSY, IPSJ-ARC [detail] | 2020-01-22 15:25 |
Kanagawa | Raiosha, Hiyoshi Campus, Keio University | Increasing Test Variation for C Compilers by Equivalent Mutant Generation Hiroki Maeda, Nagisa ishiura (Kwansei Gakuin Univ.) VLD2019-61 CPSY2019-59 RECONF2019-51 |
This article proposes a method of increasing variation of test programs in automatic testing of C compilers by means of ... [more] | VLD2019-61 CPSY2019-59 RECONF2019-51 pp.43-48 |
| DC | 2019-12-20 16:30 |
Wakayama | Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] | DC2019-85 pp.37-42 |
|
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 15:20 |
Ehime | Ehime Prefecture Gender Equality Center | A Generation Method of Easily Testable Functional k Time Expansion Model for a Transition Fault Model Using Controller Augmentation and Partial Scan Designs Yuta Ishiyama, Toshinori Hosokawa, Yuki Ikegaya (Nihon Univ.) VLD2019-43 DC2019-67 |
One of the challenges on VLSI testing is to reduce the area overhead and test application time of design-for-testability... [more] | VLD2019-43 DC2019-67 pp.133-138 |
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