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Committee Date Time Place Paper Title / Authors Abstract Paper #
ISEC, LOIS 2012-11-21
14:15		 Shizuoka Shizuoka City Industry-University Exchange Center How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion
Yuu Tsuchiya, Takeshi Kishikawa, Shohei Saito, Tsuyoshi Toyama (YNU), Akihiko Sasaki (MORITA TECH), Akashi Satoh (VDEC, Univ. Tokyo), Tsutomu Matsumoto (YNU) ISEC2012-57 LOIS2012-32		 Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] ISEC2012-57 LOIS2012-32
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