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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2011-11-29
09:50		 Miyazaki NewWelCity Miyazaki A Scan Chain Construction Method to Reduce Test Data Volume on BAST
Yun Chen, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) VLD2011-73 DC2011-49		 BAST is one of techniques which are combined ATPG and BIST to reduce the amount of test data while maintaining the high ... [more] VLD2011-73 DC2011-49
pp.127-132
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