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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, IEE-EMC, IEE-SPC | 2021-12-08 14:30 |
Aichi | (Primary: On-site, Secondary: Online) |
Measurement of Disturbance Voltage due to Indirect ESD Test on 100BASE-T1 Cable and Its Simulation Evaluation for Communication Failure Masahiro Yoshida, Yusuke Yano, Jianqing Wang (NIT), Takeshi Ishida (NoiseKen)  EMCJ2021-57 |
With the development of automobile driver assistance systems and automatic driving, the practical use of automotive Ethe... [more] | EMCJ2021-57 pp.16-21 |
| EMCJ, MICT (Joint) |
2021-03-05 09:05 |
Online | Online | Improvement of the Estimation Results by Consistency Evaluation of Measured Data for Indirect Measurement Method Noboru Maeda, Kengo Fukunaga (SOKEN), Keishi Miwa, Soichiro Ota (TMC) EMCJ2020-72 |
A consistency analysis procedure for our previously proposed indirect measurement method for the S-parameters of a multi... [more] | EMCJ2020-72 pp.1-6 |
| MW | 2019-12-19 10:55 |
Gifu | Gifu Unif. Satellite Campus | Recursive Method for S-parameter Indirect Measurement Noboru Maeda, Shinji Fukui (SOKEN), Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) MW2019-119 |
A measurement method for the S-parameters of a multiport reciprocal circuit is reported where the majority of the ports ... [more] | MW2019-119 pp.5-10 |
| EMCJ, IEE-SPC, EMD, PEM (Joint) [detail] |
2018-07-26 13:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | ESD evaluation using Optical E-Field Sensor/Optical Voltage Sensor Ryuji Osawa (Seikoh Giken) |
For the immunity test by ESD (Electro-Static Discharge),the test method is internationally specified in IEC61000-4-2. Ma... [more] | |
| MW | 2016-12-15 17:20 |
Kanagawa | National Defense Academy | Investigation of indirect S parameter estimation when the number of ports of measurement and the number of ports of the circuit to be measured are different Yuuya Kojima, Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) MW2016-152 |
An advantage of obtaining the S parameter of the device under test by indirect measurement via fixture is that the groun... [more] | MW2016-152 pp.113-117 |
| QIT (2nd) |
2015-11-24 13:40 |
Kanagawa | NTT Atsugi R&D center | [Poster Presentation]
Conditional dynamics of two level system confined by a single photon detector Yuta Ohyama, Yasuhiro Tokura (Tsukuba Univ) |
Open quantum system is described by quantum master equation. One example is Lindblad equation. This equation requires th... [more] | |
| ET | 2009-01-24 13:50 |
Kanagawa | Measurement of implicit attitudes toward people with disabilities Tokika Kurita (Kyoto Univ.), Akihiko Wakamatsu (Hiroshima Univ.), Takashi Kusumi (Kyoto Univ.) ET2008-82 |
The present study investigated implicit attitudes towards people with disabilities by FUMIE test (Mori et al., 2008) to ... [more] | ET2008-82 pp.49-51 |
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