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Committee Date Time Place Paper Title / Authors Abstract Paper #
AP 2007-03-09
14:00		 Overseas Taiwan (Yuan Ze Univ.) Study of Return Loss for a Test Board with Bonding Wires by FDTD Method
Hsing-Yi Chen, Chieh-Pin Su (Yuan Ze Univ.) AP2006-166		 Return losses of bonding wires fabricated on a test board for RF and microwave circuit applications are studied by the f... [more] AP2006-166
pp.97-100
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