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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DE, DC |
2007-10-16 11:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Evaluation Model of Pseudo Random Pattern Quality for Logic BIST Satoshi Fukumoto, Harunobu Kurokawa, Masayuki Arai, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.) DE2007-124 DC2007-21 |
In this paper, we discuss the stochastic and statistical analyses on the distribution of fault coverage in random-patter... [more] |
DE2007-124 DC2007-21 pp.51-56 |
ICD, CPM |
2005-01-28 15:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Selection of Seeds and Phase Shifters for Scan BIST Masayuki Arai, Harunobu Kurokawa, Kenichi Ichino, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.) |
In this paper, we discuss the application of a seed-selection procedure for LFSR-based BIST to multiple scan chains, com... [more] |
CPM2004-171 ICD2004-216 pp.53-58 |
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