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Committee Date Time Place Paper Title / Authors Abstract Paper #
EE, IEE-SPC 2016-07-14
10:15		 Tokyo Kikai-Shinko-Kaikan Bldg. Relationship between voltage gain tolerance and resonant circuit variation of LLC resonant converter -- Verification by Monte Carlo simulation --
Hiroyuki Haga (SHINDENGEN), Hidenori Maruta, Fujio Kurokawa (Nagasaki Univ.) EE2016-7		 LLC converter is widely used today and its characteristics and design procedure have been widely studied. However the re... [more] EE2016-7
pp.13-18
IN, IA
(Joint)		 2011-12-15
14:15		 Hiroshima Hiroshima City University Study on Effect of IP QoS Degradation on Web Usability with Severity Rating
Hiroyuki Haga, Yoshihiro Ito (NITECH) IA2011-45		 This work studies the effect of IP QoS degradation on Web usability by using Nielsen's severity rating. The severity on ... [more] IA2011-45
pp.1-6
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