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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD |
2017-04-21 14:15 |
Tokyo |
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[Invited Talk]
A 1/2.3in 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki (Sony Semiconductor Solutions), Takatsugu Yamasaki (Sony Semiconductor Manufacturing), Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga (Sony Semiconductor Solutions) ICD2017-18 |
[more] |
ICD2017-18 pp.95-98 |
ICD |
2005-04-15 11:30 |
Fukuoka |
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Burst-Cycle Data Compression Schemes for Pre-Fuse Wafer-Level Test in Large Scale High-Speed embedded DRAM Ryo Fukuda, Kenji Kobayashi (Toshiba Corp.), Masashi Akamatsu, Minoru Kaihatsu, Atsushi Tamura, Kazuo Taniguchi (Sony Corp.), Yohji Watanabe (Toshiba Corp.) |
This paper describes two novel data compression schemes suitable for high density and high speed embedded DRAMs. The par... [more] |
ICD2005-15 pp.13-17 |
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