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DC 2008-12-12
13:25		 Yamaguchi   A Test Generation Model for Threshold Testing
Kenta Sutoh, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) DC2008-60		 Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancemen... [more] DC2008-60
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