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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2016-06-20 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Binding Method for Testability to Generate Easily Testable Functional Time Expansion Models Mamoru Sato, Toshinori hosokawa, Tetsuya Masuda, Jun Nishimaki (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2016-14 |
A test generation method for datapaths using easily testable functional time expansion models was proposed as efficient ... [more] |
DC2016-14 pp.25-30 |
ICD, ITE-IST |
2009-10-02 16:35 |
Tokyo |
CIC Tokyo (Tamachi) |
A High Linear and Wide Frequency Range RF Sampling Circuit for Discrete Time Signal Processing Mamoru Sato, Hiroyuki Abe, Tadahiro Kuroda, Hiroki Ishikuro (Keio Univ.) ICD2009-59 |
This paper reports a highly linear RF sampler with wide operating frequency range and power supply range. A clock bootst... [more] |
ICD2009-59 pp.147-152 |
EMCJ, MW |
2004-10-28 - 2004-10-29 |
Iwate |
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Results of the comparison between the conventional and the using normalized site attenuation method for shielding effectiveness measurement Takuya Hoshino, Mamoru Sato (NTT AT), Masaharu Sao, Tetsuya Tominaga (NTT) |
The transmission loss method of the IEEE std.299-1997 and the insertion loss method of the IEC TS 61587-3 are widely use... [more] |
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