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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 11:20 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
Malisious tamper detector design with capacitance measurement for IoT devices in operation Ryosuke Kitayama (Waseda Univ.), Takashi Takenaka (NEC), Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2016-66 DC2016-60 |
(To be available after the conference date) [more] |
VLD2016-66 DC2016-60 pp.129-134 |
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