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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2004-12-17
11:30		 Hiroshima   The Power Reduction of Execution Circuits with Dynamic Power Control Method
Sinji Itano, Keikiti Tamaru (OUS) 		The increase of leakage current in the deep submicron MOSFET circuits becomes the serious problems. In this paper the lo... [more] ICD2004-196
pp.19-24
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