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[detail]
2006-11-28
16:10
Fukuoka
Kitakyushu International Conference Center
Test Scheduling for SoCs with Built-In Self-Repairable Memory Cores
Yusuke Fukuda
,
Tomokazu Yoneda
,
Hideo Fujiwara
(
NAIST
)
This paper presents a power-constrained test scheduling mehtod for SoCs with built-in self repairable memories which are...
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VLD2006-61
DC2006-48
pp.59-64
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