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Paper #
ICD
2006-04-14
13:50
Oita
Oita University
Worst-Case Ananlysis to Obtain Stable Read/Write DC Margin of High Density 6T-SRAM-Array with Local Vth Variability
Yasumasa Tsukamoto
,
Koji Nii
(
Renesas Technology
),
Susumu Imaoka
(
Renesas Design
),
Yuji Oda
(
Shikino High-Tech.
),
Shigeki Ohbayashi
,
Makoto Yabuuchi
,
Hiroshi Makino
,
Koichiro Ishibashi
,
Hirofumi Shinohara
(
Renesas Technology
)
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ICD2006-18
pp.97-102
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