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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 22  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
EST 2024-01-26
14:50
Kyoto Kyoto University ROHM Plaza
(Primary: On-site, Secondary: Online)
Magnetic field separation of DC signal source in geomagnetic environment by using tensor decomposition
Yuji Ogata, Tomonori Yanagida, Bunichi Kakinuma, Masayuki Kimishima (Advantest Lab) EST2023-120
In non-destructive testing and tracking using magnetic fields, it is necessary to estimate the position of the signal so... [more] EST2023-120
pp.117-122
EST 2024-01-26
15:15
Kyoto Kyoto University ROHM Plaza
(Primary: On-site, Secondary: Online)
Estimation of DC signal source position in geomagnetic environment
Tomonori Yanagida, Yuji Ogata, Bunichi Kakinuma, Masayuki Kimishima (Advantest Lab) EST2023-121
Magnetic fields have attracted attention as applications for non-contact, non-destructive measurement of objects, and in... [more] EST2023-121
pp.123-126
EST, MW, EMT, OPE, MWPTHz, IEE-EMT [detail] 2023-07-20
11:25
Hokkaido Muroran Institute of Technology
(Primary: On-site, Secondary: Online)
Investigation of phase-change material high-frequency devices by using heat transfer simulation
Taku Sato, Koji Yamashita, Hideyuki Okabe, Masayuki Kimishima (Advantest Laboratories Ltd.) EMT2023-14 MW2023-32 OPE2023-14 EST2023-14 MWPTHz2023-10
ON-OFF switching of phase-change material high-frequency switching devices is performed by reversibly changing the phase... [more] EMT2023-14 MW2023-32 OPE2023-14 EST2023-14 MWPTHz2023-10
pp.27-31
EST 2023-01-26
16:00
Okinawa
(Primary: On-site, Secondary: Online)
Estimation of magnetic dipole positions using sparse modeling
Tomonori Yanagida, Yuji Ogata, Bunichi Kakinuma, Masayuki Kimishima (Advantest Lab) EST2022-87
In recent years, magnetic fields have attracted attention as applications for non-contact, non-destructive measurement o... [more] EST2022-87
pp.70-73
SDM, ED, CPM 2022-05-27
17:05
Online Online Characterization method of semiconductors under Ohmic-metals by using multi-probe Hall devices
Kazuya Uryu (JAIST/ATL), Shota Kiuchi (JAIST), Taku Sato (ATL), Toshi-kazu Suzuki (JAIST) ED2022-15 CPM2022-9 SDM2022-22
(To be available after the conference date) [more] ED2022-15 CPM2022-9 SDM2022-22
pp.35-38
EST 2021-05-20
15:45
Online Online Separation of signal and environmental magnetic noise using independent component analysis
Kenji Yonegaki, Yanagida Tomonori, Ogata Yuji, Kakinuma Bun'ichi, Kimishima Masayuki (ATL) EST2021-7
In recent years, the demand for magnetic measurement has been increasing in a wide range of fields such as biomedicine, ... [more] EST2021-7
pp.32-35
EMT, MW, OPE, EST, MWP, THz, IEE-EMT [detail] 2020-07-16
13:00
Online Online Estimation of current source distribution with magnetocardiography measurement system
Yuji Ogata, Tomonori Yanagida, Bunichi Kakinuma, Masayuki Kimishima (Advantest Laboratories) EMT2020-9 MW2020-18 OPE2020-4 EST2020-9 MWP2020-9
 [more] EMT2020-9 MW2020-18 OPE2020-4 EST2020-9 MWP2020-9
pp.15-19
EST 2020-01-31
11:10
Oita Beppu International Convention Center Study on Quantitative Evaluation Method of Magnetocardiography Measurement System
Tomonori Yanagida, Yuji Ogata, Bunichi Kakinuma, Masayuki Kimishima (Advantest Lab) EST2019-94
The magnetocardiography is a method of capturing the electrical activity of the heart with a magnetic field. Because it ... [more] EST2019-94
pp.77-80
MW, EST, OPE, MWP, EMT, IEE-EMT, THz [detail] 2019-07-18
16:40
Hokkaido Hakodate City Central Library Octave-spanning optical frequency combs using all polarization-maintaining mode-locked fiber lasers
Takanori Okada, Shin Masuda, Masayuki Kimishima (Advantest Lab) EMT2019-18 MW2019-31 OPE2019-22 EST2019-20 MWP2019-18
We present here an optical frequency combs consisted of all polarization-maintaining fibers based on a mode-locked laser... [more] EMT2019-18 MW2019-31 OPE2019-22 EST2019-20 MWP2019-18
pp.75-80
EST, MW, OPE, MWP, EMT, IEE-EMT, THz [detail] 2018-07-20
09:15
Hokkaido   High-speed optical modulators based on epitaxially grown (Pb,La)(Zr,Ti)O3 (PLZT) thin films
Shunsuke Abe, Hideo Hara, Shin Masuda, Masayuki Kimishima (Advantest Labs.) EMT2018-33 MW2018-48 OPE2018-36 EST2018-31 MWP2018-32
LiNbO3 (LN) based modulators are widely used in optical communications because of its high reliabilities. To satisfy the... [more] EMT2018-33 MW2018-48 OPE2018-36 EST2018-31 MWP2018-32
pp.143-148
ICD, CPSY, CAS 2017-12-14
10:40
Okinawa Art Hotel Ishigakijima Performance Analysis of Level-Cross Detection Method based on Stochastic Comparator
Taiki Sugiyama, Tetsuya Iizuka (Univ. of Tokyo), Takahiro Yamaguchi (Advantest), Toru Nakura, Kunihiro Asada (Univ. of Tokyo) CAS2017-66 ICD2017-54 CPSY2017-63
ADC based on level-cross detection quantizes time rather than voltage. When the clock frequency is doubled, SNR of ADC i... [more] CAS2017-66 ICD2017-54 CPSY2017-63
pp.15-20
MW, EMCJ, EST, IEE-EMC [detail] 2017-10-19
13:55
Akita Yupopo Study of Via Hole on MMIC using Nickel Layer
Takahiro Tsushima, Masayuki Kimishima (AT Lab.) EMCJ2017-33 MW2017-85 EST2017-48
In MMIC (Microwave Monolithic Integrated Circuit) and PCB (Printed Circuit Board), nickel plating is widely used. Howeve... [more] EMCJ2017-33 MW2017-85 EST2017-48
pp.41-44
EMCJ 2015-09-04
15:10
Kyoto Keihanna Plaza Results of EMC round robin test on emission and immunity test -- (1) Radiated and conducted emission tests --
Yoshitsugu Okuda (KEC), Yasushi Asaji (Murata), Chiaki Asaba (ADVANTEST), Mikio Okumura (OMRON), Hiro Shida (Tokin), Hisashi Ninomiya (Roland), Kenji Masaoka (KEC), Yoshihide Mimura (Intertek), Osami Wada (Kyodai) EMCJ2015-57
 [more] EMCJ2015-57
pp.25-30
MW, ED 2015-01-16
09:35
Tokyo Kikai-Shinko-Kaikan Bldg. A 10 MHz to 12 GHz Low-Distortion High-Speed SP4T Switch for RF ATE Using TaON Passivation GaN HEMTs
Masayuki Kimishima, Satosi Koyama, Masao Onishi (Advantest Lab,) ED2014-125 MW2014-189
A 10 MHz – 12 GHz low distortion high speed single pole 4 throw (SP4T) GaN HEMT switch for RF Automated Test Equip... [more] ED2014-125 MW2014-189
pp.47-51
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2014-11-28
15:35
Oita B-ConPlaza [Invited Talk] An approach for 30Gb/s optical LSI volume testing
Daisuke Watanabe (Advantest), Shin Masuda (ADVANTEST Lab) CPM2014-129 ICD2014-72
With increasing data transmission capacity due to cloud computing, datacenters have an increased need for lower power an... [more] CPM2014-129 ICD2014-72
pp.39-42
ED 2012-12-18
09:00
Miyagi Tohoku University [Invited Talk] Development of a Cherenkov phase-matched terahertz source using a LiNbO3 waveguide for THz spectroscopy and imaging.
Kazunori Shiota, Shigeru Ono, Akiyoshi Irisawa, Motoki Imamura (ADVANTEST CORP.) ED2012-101
We demonstrate the development of a new type Cherenkov phase-matched terahertz source module using LiNbO3 waveguide atta... [more] ED2012-101
pp.45-50
VLD 2010-09-27
16:30
Kyoto Kyoto Institute of Technology [Invited Talk] An Automatic Test Generation Framework for Digitally-Assisted Analog Circuit
Satoshi Komatsu, Mohamed Abbas (Univ. of Tokyo), Yasuo Furukawa (Advantest), Kunihiro Asada (Univ. of Tokyo) VLD2010-46
This paper presents a new analog ATPG (AATPG) framework that generates near-optimal test stimulus for the digitally-assi... [more] VLD2010-46
pp.25-30
ICD, ITE-IST 2009-10-02
12:15
Tokyo CIC Tokyo (Tamachi) Digital Correction Algorithm of Timing Skew Effects in Time-Interleave ADC Systems
Koji Asami (Advantest), Tsuyoshi Kurosawa, Takenori Tateiwa, Hiroyuki Miyajima, Haruo Kobayashi (Gunma Univ.) ICD2009-52
This paper describes a new method to compensate for the timing skew effects in time-interleaved ADC systems. The propose... [more] ICD2009-52
pp.105-110
ICD 2006-05-26
14:45
Hyogo Kobe University 1.83ps-Resolution CMOS Dynamic Arbitrary Timing Generator for >4GHz ATE Applications
Toshiyuki Okayasu, Masakatsu Suda, Kazuhiro Yamamoto, Shusuke Kantake, Satoshi Sudou, Daisuke Watanabe (Advantest)
A high-speed, precise fully CMOS dynamic arbitrary timing generator for >4GHz automatic test equipment (ATE) application... [more] ICD2006-36
pp.83-87
ICD 2005-05-27
16:10
Hyogo Kobe Univ. A Programmable On-Chip Picosecond Jitter Measurement Circuit without a Reference Clock
Kiyotaka Ichiyama, Masahiro Ishida, Takahiro Yamaguchi (Advantest Labs.), Mani Soma (Univ. of Washington), Masakatsu Suda, Toshiyuki Okayasu, Daisuke Watanabe, Kazuhiro Yamamoto (Advantest)
A new on-chip jitter measurement circuit, which does not require a reference clock, is proposed. It consists of a combin... [more] ICD2005-38
pp.57-60
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