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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMD, R |
2017-02-17 14:00 |
Shiga |
Omuron Kusatsu Factory (Shiga) |
Effect of Hardness on Wear and Abrasion Resistance of Silver Plating on Copper Alloy Shigeru Sawada (SEI), Song-zhu Kure-chu, Rie Nakagawa, Toru Ogasawara, Hitoshi Yashiro (Iwate Uni.), Yasushi Saitoh (AN-Tech) R2016-63 EMD2016-90 |
This study is aimed at clarifying the mechanism of wear process for Ag plating with different hardness. The samples of A... [more] |
R2016-63 EMD2016-90 pp.19-24 |
EMD |
2016-11-03 16:15 |
Hyogo |
Awaji Yumebutai International Conference Center (Hyogo) |
Effect of hardness on wear and abrasion resistance of Silver plating on copper alloy Shigeru Sawada (AN-Tech), Song-zhu Kure-chu, Rie Nakagawa, Toru Ogasawara, Hitoshi Yashiro (Iwate Uni.), Yasushi Saitoh (AN-Tech) EMD2016-57 |
This study is aimed at clarifying the mechanism of wear process for Ag plating. The samples of different hardness Ag pla... [more] |
EMD2016-57 pp.41-46 |
EMD |
2011-03-04 13:30 |
Saitama |
Nippon Institute of Technology (Saitama) |
Evaluation of Contact Probe for Contact Resistance Measurement Satoru Oohira, Soushi Masui, Shigeru Sawada, Terutaka Tamai, Kazuo Iida (Mie Univ), Yasuhiro Hattori (AN-Tech) EMD2010-157 |
[more] |
EMD2010-157 pp.21-24 |
EMD, R |
2011-02-18 13:30 |
Shizuoka |
Shizuoka Univ. (Hamamatsu) (Shizuoka) |
Direct Viewing of Current in Contact Area used by Light Emission Diode Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.) R2010-43 EMD2010-144 |
[more] |
R2010-43 EMD2010-144 pp.7-12 |
EMD |
2011-01-28 13:50 |
Tokyo |
Japan Aviation Electronics Industry,Limited (Tokyo) |
Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ) EMD2010-137 |
It is observed that contact resistance for tin plated contact in automotive connectors increased due to fretting corrosi... [more] |
EMD2010-137 pp.11-16 |
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