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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM | 2011-02-07 13:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Networked nanographite growth using photoemission-assisted enhanced plasma CVD: discharge condition dependence of the crystallographic quality Shuichi Ogawa (Tohoku Univ./JST), Motonobu Sato (Fujitsu/JST), Haruki Sumi (Tohoku Univ.), Mizuhisa Nihei (Fujitsu/JST), Yuji Takakuwa (Tohoku Univ./JST)  SDM2010-220 |
he photoemission-assisted plasma chemical vapor deposition has been developed to form the graphene for large area withou... [more] | SDM2010-220 pp.25-30 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 10:40 |
Fukuoka | Kyushu University | Evaluation of frequency components of power noise in CMOS digital LSI Kumpei Yoshikawa, Hiroshi Matsumoto, Yuta Sasaki (Kobe Univ.), Makoto Nagata (Kobe Univ./CREST-JST) CPM2010-124 ICD2010-83 |
Recent trends of electric devices are higher performance and/or lower power consumption. To achieve these designs, LSI ... [more] |
CPM2010-124 ICD2010-83 pp.1-6 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 11:00 |
Fukuoka | Kyushu University | Evaluation of on-chip power noise generation and injection in SRAM core Takuya Sawada, Taku Toshikawa, Tsubasa Masui (Kobe Univ.), Makoto Nagata (Kobe Univ./CREST-JST) CPM2010-125 ICD2010-84 |
The noise tolerance of SRAM was evaluated by evaluating the power supply noise generation, and injecting the RF noise i... [more] | CPM2010-125 ICD2010-84 pp.7-12 |
| SCE | 2010-07-22 13:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Investigation to Speed Up Single-flux-quantum Circuits by Applying Higher Bias Voltage Masamitsu Tanaka, Hiroyuki Akaike, Akira Fujimaki, Kazuyoshi Takagi (Nagoya Univ./JST), Nobuyuki Yoshikawa (Yokohama National Univ./JST), Shuichi Nagasawa (SRL/JST), Naofumi Takagi (Kyoto Univ./JST) SCE2010-20 |
[more] | SCE2010-20 pp.37-40 |
| EMD, CPM, OME | 2010-06-25 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Tunneling Resistance of Double Barrier Tunneling Junction with π-Conjugated Ligand Protected Au Nanoparticles Yoshihiro Minagawa, Shinya Kano, Yasuo Azuma (Tokyo Inst. of Tech./CREST-JST), Masayuki Kanehara, Toshiharu Teranishi (Tsukuba Univ./CREST-JST), Yutaka Majima (Tokyo Inst. of Tech./CREST-JST) EMD2010-9 CPM2010-23 OME2010-28 |
[more] | EMD2010-9 CPM2010-23 OME2010-28 pp.1-5 |
| EMD, CPM, OME | 2010-06-25 14:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Contact Resistance Reduction by Porphyrin Based Self-assembled Monolayer in Pentacene Thin-film Transistors Yasuo Azuma, Taiyo Suzuki (Tokyo Inst. of Tech./CREST-JST), Yasuyuki Yamada, Kentaro Tanaka (Nagoya Univ./CREST-JST), Masayuki Kanehara, Toshiharu Teranishi (Tsukuba Univ./CREST-JST), Yutaka Majima (Tokyo Inst. of Tech./CREST-JST) EMD2010-10 CPM2010-24 OME2010-29 |
[more] | EMD2010-10 CPM2010-24 OME2010-29 pp.7-12 |
| EMD, CPM, OME | 2010-06-25 15:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Electrical property of Porphyrin molecule by scanning tunneling microscopy Shinya Kano, Yoshihiro Minagawa, Yasuo Azuma (Tokyo Inst. of Tech./CREST-JST), Yasuyuki Yamada, Kentaro Tanaka (Nagoya Univ./CREST-JST), Yutaka Majima (Tokyo Inst. of Tech./CREST-JST) EMD2010-12 CPM2010-26 OME2010-31 |
Our goal is to establish the molecular devices by using functional molecule. We demonstrate the electrical characteristi... [more] | EMD2010-12 CPM2010-26 OME2010-31 pp.19-23 |
| ED | 2010-06-18 11:25 |
Ishikawa | JAIST | Removal of Cu contaminants on silicon material surfaces by defect passivation etchless cleaning solutions Masao Takahashi, Yuko Higashi, Hiroaki Narita, Hitoo Iwasa, Hikaru Kobayashi (Osaka Univ/JST) ED2010-45 |
Dilute HCN aqueous solutions with a concentration of 1ppm can remove Cu contaminants of 10^{12}~10^{13} atomc/cm^{2} con... [more] | ED2010-45 pp.63-68 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-02 11:20 |
Kochi | Kochi City Culture-Plaza | A Reference CMOS Circuit Structure for Evaluation of Power Supply Noise Tetsuro Matsuno, Daisuke Kosaka (Kobe Univ.), Makoto Nagata (Kobe Univ./ CREST-JST) CPM2009-137 ICD2009-66 |
Accurate understandings of dynamic noises in power delivery networks of very large scale integration (VLSI) chips are st... [more] | CPM2009-137 ICD2009-66 pp.19-22 |
| ED, LQE, CPM | 2009-11-19 14:20 |
Tokushima | Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) | Theoretical Studies on the Characteristic Electronic Structures of In-Containint Nitride Seimiconductors Based of the First Principles Calculations Kenji Shiraishi, Jun-ichi Iwata (Univ. of Tsukuba/JST), Teruaki Obata (Univ. of Tsukuba), Atsushi Oshiyama (Univ. of Tokyo/JST) ED2009-138 CPM2009-112 LQE2009-117 |
In-containing nitride semiconductors exhibit characteristic behavior which can be ascribed to the large difference in th... [more] | ED2009-138 CPM2009-112 LQE2009-117 pp.47-50 |
| ED, LQE, CPM | 2009-11-20 10:55 |
Tokushima | Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) | Variation of surface properties in Mg-doped GaN Eri Ogawa, Tamotsu Hashizume (Hokkaido Univ./JST) ED2009-150 CPM2009-124 LQE2009-129 |
We have investigated chemical, electrical and optical properties of Mg-doped GaN surfaces subjected to a high-temperatur... [more] | ED2009-150 CPM2009-124 LQE2009-129 pp.105-108 |
| SCE | 2008-10-30 16:45 |
Ibaraki | AIST | Research on effective moat configuration for Nb multi-layer device structure for a cell library Kan Fujiwara, Shuichi Nagasawa, Mutsuo Hidaka (SRL/CREST-JST), Nobuyuki Yoshikawa (Yokohama National Univ./CREST-JST), Masamitsu Tanaka, Hiroyuki Akaike, Akira Fujimaki, Kazuyoshi Takagi, Naofumi Takagi (Nagoya Univ./CREST-JST) SCE2008-31 |
[more] | SCE2008-31 pp.51-56 |
| SR | 2006-04-26 10:00 |
Aichi | [Invited Talk]
Introduction of Superconducting Technology to Software-Defined Radio Receivers Akira Fujimaki (Nagoya Univ.), Akito Sekiya (JST), Yoshinori Nishido, Takuro Yamazaki (Nagoya Univ.) SR2006-4 |
Low loss, high linearity, high sensitivity, high-speed natures of suoerconducting analog/digital devices enable us to co... [more] | SR2006-4 pp.11-16 |
|
| SCE | 2005-10-14 15:20 |
Aichi | Nagoya Univ. | Quantitative evaluation of timing jitter for SFQ circuits Masayoshi Terabe (Nagoya Univ.), Akito Sekiya (CREST-JST), Akira Fujimaki (Nagoya Univ.) |
We measured the timing jitter of Josephson transmission lines with the time-to-digital converter (TDC) which can detect ... [more] | SCE2005-22 pp.25-30 |
| SR | 2005-07-29 14:20 |
Kanagawa | Yokosuka Research Park | [Technical Exhibition] Software Defined Receiver with SFQ Digital Devices Akito Sekiya (CREST-JST), Yoshinori Nishido, Hiroyuki Akaike, Hiraku Okada, Masumi Inoue, Takaya Yamazato, Akira Fujimaki, Masaaki Katayama (Nagoya University) |
[more] | SR2005-34 pp.91-96 |
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