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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
ED 2012-12-18
14:10
Miyagi Tohoku University Solar Cell Evaluation using a Laser Terahertz Emission Microscope
Iwao Kawayama (Osaka Univ.), Hidetoshi Nakanishi, Akira Ito (Dainippon Screen), Salek Abu Khandoker, Kazuhisa Takayama, Hironaru Murakami, Masayoshi Tonouchi (Osaka Univ.) ED2012-109
arious proposals using THz Time-Domain Spectroscopy (THz-TDS) have been performed in the semiconductor research field. L... [more] ED2012-109
pp.89-92
PRMU, FM 2011-12-16
10:30
Shizuoka Hamamatsu Campus, Shizuoka Univ. Automatic defect classification using Bag-of-Keypoints
Tsutomu Sakuyama, Akira Matsumura (SCREEN) PRMU2011-134
Bag-of-Keypoints(BoK) is an algorithm for image classification. The BoK is based on Scale-Invariant Feature Transform (S... [more] PRMU2011-134
pp.53-58
NC, NLP 2008-06-27
17:30
Okinawa University of the Ryukyus A Self-Organizing Model of Distributed Representation Separating Nonlinear Independent Components with Topology
Tesshin Nakada, Koji Kurata (Ryukyu Univ.), Ryuichi Kimura (DAINIPPON SCREEN MFG. CO., LTD.), kyuhee Lee (Osaka Univ.) NC2008-31
A Self-Organizing Model is proposed that can separate and represent two nonliner independent components in input.
The m... [more]
NC2008-31
pp.103-107
ED 2008-06-13
15:45
Ishikawa Kanazawa University Particle Performance Improvement of Single-Wafer Wet Cleaning for Next Generation
Ken-ichi Sano, Katsuhiko Miya, Akira Izumi, Jim Snow, Atsuro Eitoku (Dainippon Screen MFG.) ED2008-28
3X-nm particles have been measured in recent years. This study focused on small particle removal and adhesion in a semic... [more] ED2008-28
pp.35-40
 Results 1 - 4 of 4  /   
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