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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED |
2012-12-18 14:10 |
Miyagi |
Tohoku University |
Solar Cell Evaluation using a Laser Terahertz Emission Microscope Iwao Kawayama (Osaka Univ.), Hidetoshi Nakanishi, Akira Ito (Dainippon Screen), Salek Abu Khandoker, Kazuhisa Takayama, Hironaru Murakami, Masayoshi Tonouchi (Osaka Univ.) ED2012-109 |
arious proposals using THz Time-Domain Spectroscopy (THz-TDS) have been performed in the semiconductor research field. L... [more] |
ED2012-109 pp.89-92 |
PRMU, FM |
2011-12-16 10:30 |
Shizuoka |
Hamamatsu Campus, Shizuoka Univ. |
Automatic defect classification using Bag-of-Keypoints Tsutomu Sakuyama, Akira Matsumura (SCREEN) PRMU2011-134 |
Bag-of-Keypoints(BoK) is an algorithm for image classification. The BoK is based on Scale-Invariant Feature Transform (S... [more] |
PRMU2011-134 pp.53-58 |
NC, NLP |
2008-06-27 17:30 |
Okinawa |
University of the Ryukyus |
A Self-Organizing Model of Distributed Representation Separating Nonlinear Independent Components with Topology Tesshin Nakada, Koji Kurata (Ryukyu Univ.), Ryuichi Kimura (DAINIPPON SCREEN MFG. CO., LTD.), kyuhee Lee (Osaka Univ.) NC2008-31 |
A Self-Organizing Model is proposed that can separate and represent two nonliner independent components in input.
The m... [more] |
NC2008-31 pp.103-107 |
ED |
2008-06-13 15:45 |
Ishikawa |
Kanazawa University |
Particle Performance Improvement of Single-Wafer Wet Cleaning for Next Generation Ken-ichi Sano, Katsuhiko Miya, Akira Izumi, Jim Snow, Atsuro Eitoku (Dainippon Screen MFG.) ED2008-28 |
3X-nm particles have been measured in recent years. This study focused on small particle removal and adhesion in a semic... [more] |
ED2008-28 pp.35-40 |
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