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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ED (Workshop) |
2012-06-27 11:30 |
Okinawa |
Okinawa Seinen-kaikan |
The Very Fast Transferred Pixel with a Multi-Pinchoff Photodiode for Wafer-Scale X-Ray Sensor Joonghyeok Byeon, Jongmin Kim, Won-Young Jung (Dongbu Hitek), Ji-Hoon Lim, Jae-Kyung Wee (Soongsil Univ.) |
[more] |
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SDM, ED (Workshop) |
2012-06-27 17:45 |
Okinawa |
Okinawa Seinen-kaikan |
The Robust Cgd/Cgs Measurement Method of 85V nLDMOS Won-Young Jung, Jin-Soo Kim, Taek-Soo Kim (Dongbu Hitek) |
[more] |
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SDM, ED (Workshop) |
2012-06-29 08:15 |
Okinawa |
Okinawa Seinen-kaikan |
[Invited Talk]
The Stability of Bandgap Reference Voltage with Device Structures Sang-Gi Lee, Jun-Woo Song, Eun-Sang Jo, Kwang-Dong Yoo (Dongbu HiTek) |
[more] |
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ED, SDM |
2010-07-02 12:05 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
A Non-snapback NMOS ESD Clamp Circuit using Gate-Coupled Scheme with Isolated Well in a Bipolar-CMOS-DMOS Process Jae-Young Park, Dae-Woo Kim, Young-San Son, Jong-Chan Ha, Jong-Kyu Song, Chang-Soo Jang, Won-Young Jung (Dongbu HiTek) ED2010-111 SDM2010-112 |
[more] |
ED2010-111 SDM2010-112 pp.269-274 |
ED, SDM |
2010-07-02 12:20 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
A Precision Floating-Gate Mismatch Measurement Technique for Analog Applications Won-Young Jung, Jong Min Kim, Jin-Soo Kim, Taek-Soo Kim (Dongbu HiTek) ED2010-112 SDM2010-113 |
[more] |
ED2010-112 SDM2010-113 pp.275-278 |
ED, SDM |
2010-07-02 12:35 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
A Physical-Based Modeling for Accurate Wide-Width LDMOS Won-Young Jung, Jong-Sub Lee, Eun-Jin Kim, Ki-Jung Park, San-Hun Kwak, Jin-Soo Kim, Taek-Soo Kim (Dongbu HiTek) ED2010-113 SDM2010-114 |
[more] |
ED2010-113 SDM2010-114 pp.279-282 |
SDM, ED |
2009-06-24 16:00 |
Overseas |
Haeundae Grand Hotel, Busan, Korea |
Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System. Jae-Young Park, Jong-Kyu Song, Dae-Woo Kim, Chang-Soo Jang, Won-Young Jung, Taek-Soo Kim (Dongbu HiTek) ED2009-54 SDM2009-49 |
[more] |
ED2009-54 SDM2009-49 pp.17-20 |
SDM, ED |
2008-07-11 11:35 |
Hokkaido |
Kaderu2・7 |
A Latchup-Free Power-Rail ESD Clamp Circuit with Stacked-Bipolar Devices in a High-Voltage Technology Jae-Young Park, Jong-Kyu Song, Chang-Soo Jang, Joon-Tae Jang, San-Hong Kim, Sung-Ki Kim, Taek-Soo Kim (Dongbu HiTek) ED2008-76 SDM2008-95 |
The holding voltage of the high-voltage devices the snapback breakdown condition has been known to be much smaller than ... [more] |
ED2008-76 SDM2008-95 pp.193-197 |
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