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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2013-01-10
16:25		 Nagasaki Nagasaki Univ. Investigation of Correlation between Disturbance Current from Module Devices and Radiating Field Strength from Cable
Kenich Yano, Nobuo Kuwabara (KIT), Toshiki Shimasaki (NEC-E), Hidenori Muramatsu (VCCI), Kengo Mori (I-O DATA) EMCJ2012-113		  [more] EMCJ2012-113
pp.63-68
EMCJ 2012-01-27
09:05		 Fukuoka Kyushu Univ. Current distribution analysis by FDTD method for measurement circuit of kit-module above 1GHz
Yoshihiko Abe, Nobuo Kuwabara (KIT), Hidenori Muramatsu (VCCI), Toshiki Shimasaki (NEC-E) EMCJ2011-111		 The method of evaluating disturbances from the kit-modules, such as a ha
rd disk and a memory, has been proposed and is... [more]		 EMCJ2011-111
pp.1-6
ICD 2005-05-27
11:00		 Hyogo Kobe Univ. 12Gb/s duobinary signaling with x2 oversampled edge equalization
Kouichi Yamaguchi, Kazuhisa Sunaga, Shunichi Kaeriyama, Takaaki Nedachi, Makoto Takamiya, Koichi Nose, Yoshihiro Nakagawa (NEC), Mitsutoshi Sugawara (NEC-EL America), Muneo Fukaishi (NEC) 		A backplane transceiver in 90nm CMOS that employs duobinary signaling over copper traces is described. To introduce duob... [more] ICD2005-30
pp.13-18
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