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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
(Joint) [detail]
Kumamoto Kumamoto-Kenminkouryukan Parea DCNN Training with Short Bit Length Format Considering Loss of Trailing Digits
Shin-ichi O'uchi, Hiroshi Fuketa, Ryousei Takano (AIST) CPSY2017-41
Loss of trailing digits in training deep convolutional neural network (DCNN) is considered to implement training with a ... [more] CPSY2017-41
ICD, SDM, ITE-IST [detail] 2016-08-03
Osaka Central Electric Club [Invited Talk] SRAM PUF using Polycrystalline Silicon Channel FinFET and Its Evaluation
Shin-ichi O'uchi, Yungxun Liu, Yohei Hori, Toshifumi Irisawa, Hiroshi Fuketa, Yukinori Morita, Shinji Migita, Takahiro Mori, Tadashi Nakagawa, Junichi Tsukada, Hanpei Koike, Meishoku Masahara, Takashi Matsukawa (AIST) SDM2016-60 ICD2016-28
 [more] SDM2016-60 ICD2016-28
RECONF 2014-06-12
Miyagi Katahira Sakura Hall Improvement of Implementability by Exploring Routing Architecture in Flex Power FPGA
Masakazu Hioki, Toshihiro Sekigawa, Tadashi Nakagawa, Yasuhiro Ogasahara (AIST), Toshiyuki Tsutsumi (Meiji Univ.), Hanpei Koike (AIST) RECONF2014-5
(To be available after the conference date) [more] RECONF2014-5
ICD, ITE-IST 2013-07-05
Hokkaido San Refre Hakodate A Study on 1/f Noise Characteristic in Independent-Double-Gate-FinFET
Hideo Sakai (Keio Univ.), Shin-ichi O'uchi, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Yuki Ishikawa, Junichi Tsukada, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.) ICD2013-43
In this work, we measured 1/f noise of Independent-Double-Gate- (IDG-) FinFET which has two independent gates. Flicker n... [more] ICD2013-43
ICD 2011-04-19
Hyogo Kobe University Takigawa Memorial Hall 0.5-V FinFET SRAM Using Dynamic-Threshold-Voltage Pass Gates
Shin-ichi O'uchi, Kazuhiko Endo, Yongxun Liu, Takashi Matsukawa, Tadashi Nakagawa, Yuki Ishikawa, Junichi Tsukada, Hiromi Yamauchi, Toshihiro Sekigawa, Hanpei Koike, Kunihiro Sakamoto, Meishoku Masahara (AIST) ICD2011-11
This article presents a FinFET SRAM which salvages malfunctioned bits caused by random variation. In the presenting SRAM... [more] ICD2011-11
ICD, SDM 2010-08-27
Hokkaido Sapporo Center for Gender Equality On the Gate-Stack Origin Threshold Voltage Variability in Scaled FinFETs and Multi-FinFETs
Yongxun Liu, Kazuhiko Endo, Shinich Ouchi (AIST), Takahiro Kamei (Meiji Univ.), Junichi Tsukada, Hiromi Yamauchi, Yuki Ishikawa (AIST), Tetsuro Hayashida (Meiji Univ.), Kunihiro Sakamoto, Takashi Matsukawa (AIST), Atsushi Ogura (Meiji Univ.), Meishoku Masahara (AIST) SDM2010-151 ICD2010-66
The threshold voltage (Vt) variability in scaled FinFETs with gate length down to 20 nm was systematically investigated.... [more] SDM2010-151 ICD2010-66
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