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Committee Date Time Place Paper Title / Authors Abstract Paper #
NLP 2013-03-14
13:50		 Chiba Nishi-Chiba campus, Chiba Univ. Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) NLP2012-152		 Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] NLP2012-152
pp.43-48
EMD, OPE, LQE, CPM 2010-08-26
09:20		 Hokkaido Chitose Arcadia Plaza Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (9) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24		 The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24
pp.1-6
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