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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM | 2019-02-07 14:30 |
Tokyo | [Invited Talk]
Single Crystal Al Interconnects formed on p-GaN and their Application to GaN FET Takeshi Harada, Koji Utaka, Yusuke Kand, Katsuhiko Onishi, Keiichi Matsunaga, Masahiro Hikita, Yasuhiro Uemoto (Panasonic)  SDM2018-95 |
[more] | SDM2018-95 pp.19-22 |
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| SDM | 2016-10-27 13:00 |
Miyagi | Niche, Tohoku Univ. | [Invited Talk]
Novel Pixel Structure with Stacked Deep Photodiode to Achieve High NIR Sensitivity and High MTF Hiroki Takahashi, Hiroshi Tanaka, Masahiro Oda, Mitsuyoshi Ando, Naoto Niisoe (TPSCo), Shinichi Kawai, Takuya Asano, Mitsugu Yoshita, Tohru Yamada (PSCS) SDM2016-77 |
Novel pixel structure with Stacked Deep Photodiode (SDP) has been newly developed for both high Near Infra-Red (NIR) sen... [more] | SDM2016-77 pp.45-48 |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 14:30 |
Osaka | Central Electric Club | [Invited Talk]
Novel Pixel Structure with Stacked Deep Photodiode to Achieve High NIR Sensitivity and High MTF Hiroki Takahashi, Hiroshi Tanaka, Masahiro Oda, Mitsuyoshi Ando, Naoto Niisoe (TPSCo), Shinichi Kawai, Takuya Asano, Mitsugu Yoshita, Tohru Yamada (PSCS) SDM2016-51 ICD2016-19 |
Novel pixel structure with Stacked Deep Photodiode (SDP) has been newly developed for both high Near Infra-Red (NIR) sen... [more] | SDM2016-51 ICD2016-19 pp.41-44 |
| ICD, SDM, ITE-IST [detail] | 2016-08-03 09:45 |
Osaka | Central Electric Club | [Invited Talk]
A ReRAM-based Physically Unclonable Function with Bit Error Rate < 0.5% after 10 years at 125°C for 40nm embedded application Yuhei Yoshimoto, Yoshikazu Katoh, Satoru Ogasahara, Zhiqiang Wei, Kazuyuki Kouno (Panasonic Semiconductor Solutions Co., Ltd.) SDM2016-61 ICD2016-29 |
This paper presents a secure application—a physically unclonable function (PUF)—that uses the physical prope... [more] | SDM2016-61 ICD2016-29 pp.89-94 |
| ICD | 2016-04-14 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Lecture]
Reliability Projecting for ReRAM based on Stochastic Differential Equation Zhiqiang Wei (PSCS), Koji Eriguchi (Kyoto Univ.), Shunsaku Muraoka, Koji Katayama, Ryotaro Yasuhara, Kawai Ken, Yukio Hayakawa, Kazuhiko Shimakawa, Takumi Mikawa, Yoneda Shinichi (PSCS) ICD2016-7 |
An analytic formula based on stochastic differential equation is successfully developed to describe intrinsic ReRAM vari... [more] | ICD2016-7 pp.33-37 |
| SDM, ICD | 2015-08-24 09:30 |
Kumamoto | Kumamoto City | [Invited Talk]
Highly Reliable TaOx ReRAM with Centralized Filament for 28-nm Embedded Application Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, Satoru Fujii, Satoru Ito, Yoshio Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda (Panasonic) SDM2015-57 ICD2015-26 |
For 28-nm embedded application, we have proposed a TaOx-based ReRAM with precise filament positioning and high thermal s... [more] | SDM2015-57 ICD2015-26 pp.1-5 |
| ET | 2006-01-28 15:40 |
Tokyo | Development of Attendance Registration and Instruction Support System Michisuke Takahashi (Panasonic Semiconductor Solutions), Norimasa Yoshida (Sigmatron), Yosuke Kobayashi (Teikyo Univ.), Yuta Shinonaga, Hiroyuki Kumazawa (Teikyo Univ.) |
In recent years, the mobile phone becomes popular remarkably. In order to use this mobile phone effectively for the clas... [more] | ET2005-86 pp.69-74 |
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