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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 83  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2022-10-19
14:30
Online Online The effect of microstructures of CrSiC thin film resistors on the electrical properties
Nozomi Ito, Kazuyoshi Maekawa, Yuji Takahashi, Takashi Tonegawa (Renesas)
(To be available after the conference date) [more]
ICD, SDM, ITE-IST [detail] 2022-08-10
15:15
Online   [Invited Talk] A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems
Fukashi Morishita, Norihito Kato, Satoshi Okubo, Takao Toi, Mitsuru Hiraki, Sugako Otani, Hideaki Abe, Yuji Shinohara, Hiroyuki Kondo (Renesas Electronics) SDM2022-52 ICD2022-20
This paper presents a CMOS image sensor and an AI accelerator to realize surveillance camera systems based on edge compu... [more] SDM2022-52 ICD2022-20
pp.83-86
SDM 2021-11-12
10:30
Online Online [Invited Talk] Full band Monte Carlo analysis of the uniaxial stress impact on 4H-SiC high energy transport
Tomoya Nishimura, Katsumi Eikyu, Kenichiro Sonoda, Tamotsu Ogata (Renesas Electronics) SDM2021-61
SiC is expected to be the next-generation semiconductor material especially for power devices, and some have been put in... [more] SDM2021-61
pp.43-46
SDM, ICD, ITE-IST [detail] 2021-08-18
13:00
Online Online [Invited Talk] A 12nm autonomous driving processor running 60.4 TOPS and 13.8 TOPS/W CNNs with task-separated ASIL D control
Katsushige Matsubara, Lieske Hanno (Renesas Electronics), Motoki Kimura (Renesas Electronics Europe), Atsushi Nakamura, Manabu Koike, Kazuaki Terashima, Shun Morikawa, Yoshihiko Hotta, Takahiro Irita, Seiji Mochizuki, Hiroyuki Hamasaki, Tatsuya Kamei (Renesas Electronics) SDM2021-39 ICD2021-10
Next-generation driver assistance systems and automated driving systems require both high performances to realize enormo... [more] SDM2021-39 ICD2021-10
pp.48-53
DC 2021-02-05
14:25
Online Online Fault Coverage Estimation Method in Multi-Cycle Testing
Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas Electronics Corp.) DC2020-75
 [more] DC2020-75
pp.36-41
SDM 2020-11-19
15:20
Online Online [Invited Talk] A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel
Tatsuya Kunikiyo, Hidenori Sato, Takeshi Kamino, Koji Iizuka, Ken'ichiro Sonoda, Tomohiro Yamashita (Renesas Electronics) SDM2020-26
A novel phase-detection auto focus (PDAF) technique for incident 850 nm plane wave is demonstrated using Ge-on-Si layer ... [more] SDM2020-26
pp.21-24
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-17
11:20
Online Online Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test
Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34
 [more] VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34
pp.24-29
DC 2020-02-26
10:25
Tokyo   Defective Chip Prediction Modeling Using Convolutional Neural Networks
Ryunosuke Oka, Satoshi Ohtake (Oita Univ.), Kouichi Kumaki (Renesas) DC2019-87
In recent years, the cost of LSI testing which guarantees reliability has relatively increased due to the development of... [more] DC2019-87
pp.7-12
DC 2020-02-26
11:35
Tokyo   Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing
Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] DC2019-89
pp.19-24
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-14
16:10
Ehime Ehime Prefecture Gender Equality Center Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method
Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test
(POST) is require... [more]
VLD2019-45 DC2019-69
pp.145-150
SDM, ICD, ITE-IST [detail] 2019-08-07
16:30
Hokkaido Hokkaido Univ., Graduate School /Faculty of Information Science and [Invited Talk] High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications
Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) SDM2019-39 ICD2019-4
Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is d... [more] SDM2019-39 ICD2019-4
pp.15-19
SDM, ICD, ITE-IST [detail] 2019-08-09
10:50
Hokkaido Hokkaido Univ., Graduate School /Faculty of Information Science and [Invited Talk] A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture supporting ISO26262 ASIL-D
Naoto Okumura, Sugako Otani, Norimasa Otsuki, Yasufumi Suzuki, Shohei Maeda, Tomonori Yanagita, Takao Koike, Masao Ito, Minoru Uemura, Yasuhisa Shimazaki, Toshihiro Hattori, Noriaki Sakamoto, Hiroyuki Kondo (Renesas Electronics Corp.) SDM2019-47 ICD2019-12
Along with the rapid progress of automotive Electrical/Electronic(E/E) architecture, further integration of multiple ele... [more] SDM2019-47 ICD2019-12
pp.67-71
CAS, CS 2019-03-08
15:00
Kanagawa Shonan Institute of Technology [Special Invited Talk] The latest trends of Automotive Ethernet
Tomofumi Hokari, Nobukatsu Kitajima (Renesas) CAS2018-145 CS2018-113
To support Autonomous driving and Connected car applications, Automotive Ethernet has been adopted widely around the wor... [more] CAS2018-145 CS2018-113
p.39
DC 2019-02-27
09:25
Tokyo Kikai-Shinko-Kaikan Bldg. Variational Autoencoder-Based Efficient Test Escape Detection
Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72
 [more] DC2018-72
pp.7-12
HWS
(2nd)
2018-12-13
15:05
Tokyo Tokyo Univ. Takeda Bldg. Takeda Hall Issues in industrial equipment installed in the factory and Renesas' initiatives
Tsukasa Yobo (Renesas Electronics)
(Advance abstract in Japanese is available) [more]
SDM, ICD, ITE-IST [detail] 2018-08-09
13:10
Hokkaido Hokkaido Univ., Graduate School of IST M Bldg., M151 12-nm Fin-FET 3.0G-search/s 80-bit x 128-entry Dual-port Ternary CAM
Makoto Yabuuchi, Masao Morimoto, Koji Nii, Shinji Tanaka (Renesas) SDM2018-48 ICD2018-35
 [more] SDM2018-48 ICD2018-35
pp.115-120
ICD 2018-04-20
10:20
Tokyo   [Invited Lecture] An Implementation of 2RW Dual-Port SRAM using 65 nm Silicon-on-Thin-Box (SOTB) for Smart IoT
Yohei Sawada, Yoshiki Yamamoto, Takumi Hasegawa, Hiroki Shinkawata, Makoto Yabuuchi (REL), Yoshihiro Shinozaki, Kyoji Ito (NSW), Shinji Tanaka, Nii Koji, Shiro Kamohara (REL) ICD2018-8
 [more] ICD2018-8
pp.29-32
IPSJ-ARC, VLD, CPSY, RECONF, IPSJ-SLDM [detail] 2018-01-19
16:40
Kanagawa Raiosha, Hiyoshi Campus, Keio University Mutant Generation of Performance Tests for LLVM Back-Ends
Kenji Tanaka, Nagisa Ishiura (Kwansei Gakuin Univ.), Masanari Nishimura, Akiya Fukui (Renesas) VLD2017-88 CPSY2017-132 RECONF2017-76
This article presents a method of testing optimization capability of LLVM back-ends by generating functionally equivalen... [more] VLD2017-88 CPSY2017-132 RECONF2017-76
pp.169-174
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2017-11-06
14:55
Kumamoto Kumamoto-Kenminkouryukan Parea An Approach to Selection of Classifiers and their Thresholds for Machine Learning Based Fail Chip Prediction
Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas Electronics) VLD2017-36 DC2017-42
Today, semiconductor technologies have developed and advance the integration density of LSI circuits.
A technique which... [more]
VLD2017-36 DC2017-42
pp.55-60
SDM 2017-10-26
13:00
Miyagi Niche, Tohoku Univ. [Invited Lecture] High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SG-MONOS flash memory for security applications
Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) SDM2017-58
Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is d... [more] SDM2017-58
pp.45-49
 Results 1 - 20 of 83  /  [Next]  
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