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Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS, VLD 2023-03-01
11:25
Okinawa
(Primary: On-site, Secondary: Online)
Pass/Fail Threshold Determination Based on Gaussian Process Regression in LSI Test
Daisuke Goeda (KIT), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (SCK), Michihiro Shintani (KIT) VLD2022-74 HWS2022-45
 [more] VLD2022-74 HWS2022-45
pp.7-12
VLD, HWS [detail] 2022-03-08
09:55
Online Online Wafer-Level Characteristic Variation Modeling with Considering Discontinuous Effect Caused by Manufacturing Equipment
Takuma Nagao (National Institute of Technology (KOSEN)), Michihiro Shintani (Nara Institute of Science and Technology), Ken'ichi Yamaguchi, Hiroshi Iwata (National Institute of Technology (KOSEN)), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (SCK), Michiko Inoue (Nara Institute of Science and Technology) VLD2021-92 HWS2021-69
Statistical methods for predicting the performance of large-scale integrated circuits (LSIs) manufactured on a wafer are... [more] VLD2021-92 HWS2021-69
pp.87-92
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