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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| LQE, ED, CPM | 2023-12-01 09:25 |
Shizuoka | Simultaneous microscopic PA/PL line-scan measurements in InGaN-QWs on Stripecore GaN Substrate Syoki Jinno, Keito Mori-Tamamura, Atsushi A. Yamaguchi (Kanazawa Inst. of Tech.), Susumu Kusanagi, Yuya Kanitani, Shigetaka Tomiya, Yoshihiro Kudo (Sony Semiconductor Solutions Corp.) |
[more] | ||
| LQE, ED, CPM | 2023-12-01 09:50 |
Shizuoka | Polarization control of surface emission from c-plane InGaN quantum wells and determination of deformation potential in InGaN alloy materials Keito Mori-Tamamura, Atsushi A. Yamaguchi (Kanazawa Inst. Tech), Tomohiro Makino, Maho Ohara, Tatsushi Hamaguchi, Rintaro Koda (Sony Semiconductor Solutions) |
[more] | ||
| ITE-IDY, EID, SID-JC [detail] | 2023-08-04 16:10 |
Online | Online (Zoom) | [Invited Talk]
360-degree Transparent Light Field Display with Highly-Directional Holographic Screens for Fully Volumetric 3D Video Experience Tomoharu Nakamura, Yuriko Imai, Yuta Yoshimizu, Koji Kuramoto, Noriyuki Kato, Hiroshi Suzuki, Yuji Nakahata, Kazumasa Nomoto (Sony) |
[more] | |
| SDM, ICD, ITE-IST [detail] | 2023-08-02 10:45 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
[Invited Talk]
The Image Sensor Technology: Building the Foundation for Information Sensing Societies Hayato Wakabayashi (Sony Semiconductor Solutions) |
[more] | |
| MRIS, ITE-MMS | 2023-06-08 15:50 |
Miyagi | Tohoku Univ. （RIEC) (Primary: On-site, Secondary: Online) |
Development of CoPtCr-oxide granular typed sputtered tape with oxygen deficiency compensation from Co oxide-added composite target Junichi Tachibana, HIroyuki Kobayashi, Teruo Sai, Takashi Aizawa (Sony Storage Media Solutions), Shin Saito (Tohoku Univ.)  MRIS2023-4 |
The oxidization in the granular recording layer controlled by changing the amount of Co3O4 added to the CoPtCr-SiO2 comp... [more] | MRIS2023-4 pp.21-26 |
| PRMU, IBISML, IPSJ-CVIM [detail] | 2023-03-02 14:30 |
Hokkaido | Future University Hakodate (Primary: On-site, Secondary: Online) |
[Invited Talk]
-- Masato Ishii (Sony) PRMU2022-86 IBISML2022-93 |
[more] | PRMU2022-86 IBISML2022-93 p.148 |
| SANE, SAT (Joint) |
2023-03-02 10:30 |
Okinawa | (Primary: On-site, Secondary: Online) |
Evaluation of the communication quality with Forward Error Correction and Delay Tolerant Networking Hiromitsu Komatsu, Kai Suzuki (Sony CSL), Kiyohisa Suzuki, Yu Morinaga (JAXA) SAT2022-58 |
Non-terrestrial networks (NTN) using satellites and stratospheric platforms are required to expand Internet coverage and... [more] | SAT2022-58 pp.17-21 |
| HWS, VLD | 2023-03-01 11:25 |
Okinawa | (Primary: On-site, Secondary: Online) |
Pass/Fail Threshold Determination Based on Gaussian Process Regression in LSI Test Daisuke Goeda (KIT), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (SCK), Michihiro Shintani (KIT) VLD2022-74 HWS2022-45 |
[more] | VLD2022-74 HWS2022-45 pp.7-12 |
| HWS, VLD | 2023-03-02 13:25 |
Okinawa | (Primary: On-site, Secondary: Online) |
[Memorial Lecture]
Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects Takuma Nagao (NAIST), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (Sony Semiconductor Manufacturing), Michiko Inoue (NAIST), Michihiro Shintani (Kyoto Institute of Technology) VLD2022-91 HWS2022-62 |
Statistical wafer-level variation modeling is an attractive method for reducing the measurement cost in large-scale inte... [more] | VLD2022-91 HWS2022-62 p.109 |
| EST | 2023-01-26 13:50 |
Okinawa | (Primary: On-site, Secondary: Online) |
Basic Study of Electrio Magnetic Field Analysis of PCB based on DDM Type Parallel Finite Element Method Kanta Nishijima (UoM), Sota Goto, Toshio Murayama (Sony GM&O), Amane Takei (UoM) EST2022-81 |
In this study, we will verify the applicability of parallel high-frequency electromagnetic field analysis based on the e... [more] | EST2022-81 pp.39-42 |
| NS, NWS (Joint) |
2023-01-26 13:50 |
Yamaguchi | Hybrid Meeting (Yamaguchi Prefecture) (Primary: On-site, Secondary: Online) |
[Encouragement Talk]
Wireless LAN Quality Estimation Using Federated Learning with Privacy Protection and Large-Scale Learning Koki Horita, Masanobu Jimbo, Thomas Carette (Sony), Akihiro Nakao (UTokyo) NS2022-155 |
Switching network algorithm of a smartphone between WLAN and cellular is not based on the quality of the communication c... [more] | NS2022-155 pp.31-36 |
| MBE, NC | 2022-12-03 13:55 |
Osaka | Osaka Electro-Communication University | Influence of skill learning on speed invariance of finger motions
-- comparisons among professional pianists, dystonia patients, and non-musicians -- Sanshiro Takeda (TUAT), Shinichi Furuya (SONY CSL), Ken Takiyama (TUAT) MBE2022-36 NC2022-58 |
Body movements under various movement speeds retain speed-invariant kinematic features. Although the speed invariance... [more] |
MBE2022-36 NC2022-58 pp.62-67 |
| EID, IEE-EDD, ITE-3DMT, ITE-AIT, ITE-IDY, VRSJ, IIEEJ [detail] | 2022-11-25 15:50 |
Tokyo | Hibiya Library & Museum +Online (Zoom) (Primary: On-site, Secondary: Online) |
[Invited Talk]
* Yuji Nakahata (Sony Group) |
[more] | |
| CPM, ED, LQE | 2022-11-25 10:35 |
Aichi | Winc Aichi (Aichi Industry & Labor Center) (Primary: On-site, Secondary: Online) |
[Encouragement Talk]
Experimental studies on the recombination mechanism in III-nitride semiconductors by simultaneous measurements of radiative and non-radiative recombinations Keito Mori-Tamamura, Yuya Morimoto, Atsushi A. Yamaguchi (Kanazawa Inst. of Tech.), Susumu Kusanagi, Yuya Kanitani, Yoshihiro Kudo, Shigetaka Tomiya (Sony) ED2022-40 CPM2022-65 LQE2022-73 |
The carrier dynamics in active layers of III-nitride-based optical devices, has not been fully understood, yet. We belie... [more] | ED2022-40 CPM2022-65 LQE2022-73 pp.73-76 |
| CS, IE, IPSJ-AVM, ITE-BCT [detail] | 2022-11-24 15:20 |
Aichi | Nagoya Institute of Technology (Primary: On-site, Secondary: Online) |
Locating the Fruit to Be Harvested and Estimating their Cut Positions from RGBD Images Acquired by a Camera Moved along a Fixed Path Using a Mask-RCNN Based Method Wentao Zhao, Jun Ohya, Chanjin Seo, Takuya Otani, Taiga Tanaka, Koki Masaya, Atsuo Takanishi (Waseda Univ.), Shuntaro Aotake, Masatoshi Funabashi (SONY CSL) CS2022-55 IE2022-43 |
This paper proposes a Mask R-CNN[1] based method for locating fruits (tomatoes and yellow bell peppers, etc.) and estima... [more] | CS2022-55 IE2022-43 pp.39-44 |
| SIS, ITE-BCT | 2022-10-13 15:00 |
Aomori | Hachinohe Institute of Technology (Primary: On-site, Secondary: Online) |
[Special Talk]
Efforts to Create a "Space Excitement Experience Business” Kensuke Motomura (Sony) |
[more] | |
| SAT, RCS (Joint) |
2022-08-25 15:10 |
Hokkaido | (Primary: On-site, Secondary: Online) |
[Invited Lecture]
Research, development, and demonstration of a compact optical communication system based on optical disk technology Hiroaki Yamazoe, Kyohei Iwamoto (Sony CSL) SAT2022-34 RCS2022-109 |
Free-space optical communication is expected to be a fundamental technology for realizing Beyond 5G/6G. Since laser ligh... [more] | SAT2022-34 RCS2022-109 pp.30-35(SAT), pp.66-71(RCS) |
| ICD, SDM, ITE-IST [detail] | 2022-08-08 09:15 |
Online | [Invited Talk]
A 2-Layer Transistor Pixel Stacked CMOS Image Sensor with Oxide Based Full Trench Isolation for Large Full Well Capacity and High Quantum Efficiency Koichiro Zaitsu, Akira Matsumoto, Mizuki Nishida, Yusuke Tanaka, Hirofumi Yamashita, Yosuke Satake (Sony Semiconductor Solutions), Takashi Watanabe, Kunihiko Araki, Naoki Nei (Sony Semiconductor Manufacturing), Keiichi Nakazawa, Junpei Yamamoto, Mutsuo Uehara (Sony Semiconductor Solutions), Hiroyuki Kawashima, Yusaku Kobayashi (Sony Semiconductor Manufacturing), Tomoyuki Hirano, Keiji Tatani (Sony Semiconductor Solutions) SDM2022-33 ICD2022-1 |
(To be available after the conference date) [more] | SDM2022-33 ICD2022-1 pp.1-6 |
|
| ICD, SDM, ITE-IST [detail] | 2022-08-08 10:00 |
Online | [Invited Talk]
Low-Noise Multi-Gate Pixel Transistor for Sub-Micron Pixel CMOS Image Sensors Naohiko Kimizuka, Shota Kitamura, Akiko Honjo, Koichi Baba, Toshihiro Kurobe, Hideomi Kumano, Takuya Toyohuku (Sony Semiconductor Solutions), Kouhei Takeuchi, Shota Nishimura (Sony Semiconductor Manufacturing), Akihiko Kato, Tomoyuki Hirano, Yusuke Oike (Sony Semiconductor Solutions) SDM2022-34 ICD2022-2 |
The pixel size of CMOS image sensor (CIS) continues to be rapidly decreasing due to strong demand from mobile applicatio... [more] | SDM2022-34 ICD2022-2 p.7 |
|
| MRIS, ITE-MMS | 2022-06-09 13:55 |
Miyagi | RIEC, Tohoku Univ. (Primary: On-site, Secondary: Online) |
M-H curve and Read-Write Simulations considering Thermal Agitation Ikuya Tagawa (TohTech), Satoshi Kodama, Junichi Tachibana, Takashi Aizawa, Minoru Yamaga (SSMS) MRIS2022-2 |
[more] | MRIS2022-2 pp.7-12 |
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