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Committee Date Time Place Paper Title / Authors Abstract Paper #
CS, CAS 2020-02-27
11:45		 Kumamoto   Detecting Resistive-Open Defects of Power TSVs in 3D-ICs
Koutaro Hachiya (Teikyo Heisei Univ.), Atsushi Kurokawa (Hirosaki Univ.) CAS2019-104 CS2019-104		 A method is proposed which detects resistive-open defects of power TSVs in PDNs by measuring resistance between power mi... [more] CAS2019-104 CS2019-104
pp.37-41
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