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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMT, PN, LQE, OPE, MWP, EST, IEE-EMT [detail] |
2012-01-27 13:50 |
Osaka |
Osaka Univ. Convention Center |
Input signal characteristics in Optical Label Processing Using Complex-Valued Neural Network Kengo Mizote, Hiroki Kishikawa, Nobuo Goto, Shin-ichiro Yanagiya (The Univ of Tokushima) PN2011-73 OPE2011-189 LQE2011-175 EST2011-123 MWP2011-91 |
[more] |
PN2011-73 OPE2011-189 LQE2011-175 EST2011-123 MWP2011-91 pp.287-292 |
EMT, PN, LQE, OPE, MWP, EST, IEE-EMT [detail] |
2012-01-27 14:15 |
Osaka |
Osaka Univ. Convention Center |
Increase of Recognizable BPSK Labels Using Waveguide Circuits Consisting of Cascaded Asymmetric X-junction Couplers Akito Ihara, Hiroki Kishikawa, Nobuo Goto, Shin-ichiro Yanagiya (The Univ of Tokushima) PN2011-74 OPE2011-190 LQE2011-176 EST2011-124 MWP2011-92 |
We proposed a waveguide device for recognition of optical BPSK labels in photonic label routers.
The device consists of... [more] |
PN2011-74 OPE2011-190 LQE2011-176 EST2011-124 MWP2011-92 pp.293-298 |
ED, LQE, CPM |
2009-11-20 11:20 |
Tokushima |
Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) |
Analysis of AlGaN/GaN HFET Current Collapse By Step Stress Measurement Kentaro Kuroda, Yusuke Ikawa, Kenta Mituyama, Jin-Ping Ao, Yasuo Ohno (The Univ of Tokushima) ED2009-151 CPM2009-125 LQE2009-130 |
Current Collapse of AlGaN/GaN HFET is assumed that a negative charge in the device by Drain bias is a cause. The process... [more] |
ED2009-151 CPM2009-125 LQE2009-130 pp.109-114 |
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