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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMT, PN, LQE, OPE, MWP, EST, IEE-EMT [detail] 2012-01-27
13:50
Osaka Osaka Univ. Convention Center Input signal characteristics in Optical Label Processing Using Complex-Valued Neural Network
Kengo Mizote, Hiroki Kishikawa, Nobuo Goto, Shin-ichiro Yanagiya (The Univ of Tokushima) PN2011-73 OPE2011-189 LQE2011-175 EST2011-123 MWP2011-91
 [more] PN2011-73 OPE2011-189 LQE2011-175 EST2011-123 MWP2011-91
pp.287-292
EMT, PN, LQE, OPE, MWP, EST, IEE-EMT [detail] 2012-01-27
14:15
Osaka Osaka Univ. Convention Center Increase of Recognizable BPSK Labels Using Waveguide Circuits Consisting of Cascaded Asymmetric X-junction Couplers
Akito Ihara, Hiroki Kishikawa, Nobuo Goto, Shin-ichiro Yanagiya (The Univ of Tokushima) PN2011-74 OPE2011-190 LQE2011-176 EST2011-124 MWP2011-92
We proposed a waveguide device for recognition of optical BPSK labels in photonic label routers.
The device consists of... [more]
PN2011-74 OPE2011-190 LQE2011-176 EST2011-124 MWP2011-92
pp.293-298
ED, LQE, CPM 2009-11-20
11:20
Tokushima Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) Analysis of AlGaN/GaN HFET Current Collapse By Step Stress Measurement
Kentaro Kuroda, Yusuke Ikawa, Kenta Mituyama, Jin-Ping Ao, Yasuo Ohno (The Univ of Tokushima) ED2009-151 CPM2009-125 LQE2009-130
Current Collapse of AlGaN/GaN HFET is assumed that a negative charge in the device by Drain bias is a cause. The process... [more] ED2009-151 CPM2009-125 LQE2009-130
pp.109-114
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