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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| SDM |
2023-01-30
14:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. B3-1 |
[Invited Talk]
Design guidlines for SBD integration into SiC-MOSFET breaking RonA- diode conduction capability trade-off
Shunsuke Asaba, Masaru Furukawa, Yuji Kusumoto (Toshiba D&S), Ryosuke Iijima (Toshiba), Hiroshi Kono (Toshiba D&S)  SDM2022-82 |
Degradation in performance due to the bipolar current through parasitic diode during reverse operation of SiC-MOSFET can... [more] |
SDM2022-82
pp.13-16 |
| SDM |
2020-11-20
11:30 |
Online |
Online |
[Invited Talk]
Three-dimensional device simulation of Si IGBTs
-- Investigation of physical models and comparisons with measurements --
Naoyuki Shigyo, Masahiro Watanabe, Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa (Tokyo Tech), Akira Nakajima (AIST), Katsumi Satoh (Mitsubishi Electric), Tomoko Matsudai (Toshiba), Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (The Univ. of Tokyo), Hitoshi Wakabayashi, Iriya Muneta (Tokyo Tech), Shin-ichi Nishizawa (Kyushu Univ.), Kazuo Tsutsui (Tokyo Tech), Toshiro Hiramoto (The Univ. of Tokyo), Hiromichi Ohashi, Hiroshi Iwai (Tokyo Tech) SDM2020-30 |
[more] |
SDM2020-30
pp.36-40 |
| SDM |
2019-11-08
13:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Three-dimensional accurate TCAD simulation of trench-gate Si-IGBTs
Masahiro Watanabe, Naoyuki Shigyo, Takuya Hoshii, Kazuyoshi Furukawa, Kuniyuki Kakushima (Tokyo Tech.), Katsumi Satoh (Mitsubishi Electric Corp.), Tomoko Matsudai (Toshiba Electronic Devices & Storage Corp.), Takuya Saraya, Toshihiko Takakura, Kazuo Itou, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (The University of Tokyo), Iriya Muneta, Hitoshi Wakabayashi (Tokyo Tech.), Akira Nakajima (AIST), Shin-ichi Nishizawa (Kyushu University, Kasuga), Kazuo Tsutsui (Tokyo Tech.), Toshiro Hiramoto (The University of Tokyo), Hiromichi Ohashi, Hiroshi Iwai (Tokyo Tech.) SDM2019-77 |
In this work, excellent agreement between 3D TCAD simulations and experimental current-voltage characteristics were obta... [more] |
SDM2019-77
pp.45-48 |
| SDM |
2019-11-08
14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Investigation of TCAD Calibration Methods for Saturation and Tail Current of 6.5kV IGBTs
Takeshi Suwa, Shigeaki Hayase (TDSC) SDM2019-78 |
In this work we focus on two calibration methods to clarify a key point of TCAD calibration for turn-off waveforms and I... [more] |
SDM2019-78
pp.49-54 |
| SDM, ICD, ITE-IST [detail] |
2019-08-08
10:25 |
Hokkaido |
Hokkaido Univ., Graduate School /Faculty of Information Science and |
[Invited Lecture]
3300V Scaled IGBT Switched by 5V Gate Drive
Toshiro Hiramoto, Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (Univ. of Tokyo), Masanori Tsukuda (Green Electronics Research Inst.), Yohichiroh Numasawa (Meiji Univ,), Katsumi Satoh (Mitsubishi Electric Corp), Tomoko Matsudai (Toshiba Electronic Devices & Storage Corp.), Wataru Saito (Kyushu Univ.), Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Hitoshi Wakabayashi, Kazuo Tsutsui, Hiroshi Iwai (Tokyo Inst. of Technology), Atsushi Ogura (Meiji Univ.), Shin-ichi Nishizawa (Kyushu Univ.), Ichiro Omura (Kyushu Inst. of Tech.), Hiromichi Ohashi (Tokyo Inst. of Tech.) SDM2019-42 ICD2019-7 |
[more] |
SDM2019-42 ICD2019-7
pp.31-34 |
| SDM |
2019-01-29
15:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Demonstration of 1200V Scaled IGBTs Driven by 5V Gate Voltage with Superiorly Low Switching Loss
Takuya Saraya, Kazuo Itou, Toshihiko Takakura, Munetoshi Fukui, Shinichi Suzuki, Kiyoshi Takeuchi (Univ. of Tokyo), Masanori Tsukuda (GRIK), Yohichiroh Numasawa (Meiji Univ.), Katsumi Satoh (Mitsubishi Electric), Tomoko Matsudai, Wataru Saito (Toshiba Electronic Devices & Storage), Kuniyuki Kakushima, Takuya Hoshii, Kazuyoshi Furukawa, Masahiro Watanabe, Naoyuki Shigyo, Kazuo Tsutsui, Hiroshi Iwai (Tokyo Tech), Atsushi Ogura (Meiji Univ.), Shin-ichi Nishizawa (Kyushu Univ.), Ichiro Omura (Kyushu Inst. of Tech.), Hiromichi Ohashi (Tokyo Tech), Toshiro Hiramoto (Univ. of Tokyo) SDM2018-90 |
Functional trench-gated 1200V-10A class Si-IGBTs, designed based on the scaling concept, were fabricated, and 5V gate vo... [more] |
SDM2018-90
pp.39-44 |
| EST, MW, OPE, MWP, EMT, IEE-EMT, THz [detail] |
2018-07-19
09:45 |
Hokkaido |
|
[Invited Talk]
A Long-Range High-Resolution Distance Measurement SoC for Self-Driving LiDAR Systems
Akihide Sai, Kentaro Yoshioka (Toshiba), Hiroshi Kubota (Toshiba Electronic Devices & Storage), Satoshi Kondo, Tuan Thanh Ta, Hidenori Okuni (Toshiba), Katsuyuki Kimura, Yutaka Oota, Tomohiro Sugimoto, Daisuke Kurose, Hirotomo Ishii, Nobu Matsumoto (Toshiba Electronic Devices & Storage) EMT2018-8 MW2018-23 OPE2018-11 EST2018-6 MWP2018-7 |
This paper presents a TDC/ADC hybrid LiDAR SoC to realize reliable self-driving systems. The smart accumulation techniqu... [more] |
EMT2018-8 MW2018-23 OPE2018-11 EST2018-6 MWP2018-7
pp.7-12 |
| ASN |
2018-01-30
14:15 |
Oita |
Yufugo-kan (Oita) |
Proposal of MU-MIMO Cooperative Retransmission Control Scheme in Wireless LAN Systems
Kiyoshi Toshimitsu (TDSC), Takefumi Hiraguri (NIT), Kentaro Nishimori (Niigata Univ.), Yoshiaki Morino, Isamu Shitara, Tsutomu Mitsui, Hideaki Yoshino (NIT) ASN2017-91 |
In this paper, we propose a MU-MIMO cooperative retransmission control scheme to achieve high reliability and high trans... [more] |
ASN2017-91
pp.47-52 |
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