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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2013-02-13 13:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
On Fault detection method considering adjacent TSVs for a delay fault in TSV Masanori Nakamura, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ.of Tokushima) DC2012-85 |
We propose a fault detection method for a TSV (through-Silicon via) considering adjacent TSVs for detecting delay caused... [more] |
DC2012-85 pp.31-36 |
ED, SDM, R |
2006-11-24 15:15 |
Osaka |
Central Electric Club |
Effects of heterointerface flatness on device performance of InP-based HEMT
-- Reduction of interface roughness scattering using (411)A-oriented substrate -- Issei Watanabe (NICT), Keisuke Shinohara (Rockwell), Takahiro Kitada (Univ.of Tokushima), Satoshi Shimomura (Ehimeiv.), Akira Endoh, Yoshimi Yamashita, Takashi Mimura (Fujitsu Labs.), Satoshi Hiyamizu (Osaka Univ./Nara National College of Tech.), Toshiaki Matsui (NICT) |
[more] |
R2006-35 ED2006-180 SDM2006-198 pp.21-25 |
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