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 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS, ICD 2018-10-29
13:50		 Osaka Kobe Univ. Umeda Intelligent Laboratory Hardware Design of High Precision Discrete Gaussian Sampler for Lattice-based Cryptography
Keitaro Koga (UTokyo), Awano Hiromitsu (VDEC), Ikeda Makoto (UTokyo) HWS2018-49 ICD2018-41		 Since quantum computer is developed to be more practical, Post-Quantum Cryptography (PQC) that is not solved with quantu... [more] HWS2018-49 ICD2018-41
pp.13-18
ISEC, LOIS 2012-11-21
14:15		 Shizuoka Shizuoka City Industry-University Exchange Center How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion
Yuu Tsuchiya, Takeshi Kishikawa, Shohei Saito, Tsuyoshi Toyama (YNU), Akihiko Sasaki (MORITA TECH), Akashi Satoh (VDEC, Univ. Tokyo), Tsutomu Matsumoto (YNU) ISEC2012-57 LOIS2012-32		 Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] ISEC2012-57 LOIS2012-32
pp.1-8
ICD, ITE-IST 2011-07-22
09:50		 Hiroshima Hiroshima Institute of Technology On-Chip Resonant Supply Noise Reduction Using Active Decoupling Capacitors
Jinmyoung Kim (Tokyo Univ.), Toru Nakura (VDEC), Hidehiro Takata, Koichiro Ishibashi (Renesas Electronics), Makoto Ikeda, Kunihiro Asada (VDEC) ICD2011-27		  [more] ICD2011-27
pp.69-72
DC, CPSY, IPSJ-SLDM, IPSJ-EMB 2008-03-28
10:30		 Kagoshima   A technique of automatic input pattern generation for system-level design descriptions by concrete and symbolic simulations
Yoshihisa Kojima, Tasuku Nishihara, Takeshi Matsumoto (Univ. of Tokyo), Masahiro Fujita (VDEC, Univ of Tokyo) DC2007-106 CPSY2007-102		 As the VLSI systems grow larger and more complicated, it becomes more difficult to manually prepare the input patterns o... [more] DC2007-106 CPSY2007-102
pp.133-138
VLD, ICD 2008-03-05
13:00		 Okinawa TiRuRu Automatic synthesis and verification of practical protocol transducer based on product graph exploration
Yuji Ishikawa (Univ. of Tokyo), Satoshi Komatsu, Masahiro Fujita (VDEC, Univ. of Tokyo) VLD2007-137 ICD2007-160		  [more] VLD2007-137 ICD2007-160
pp.1-6
ICD, ITE-IST 2007-07-27
10:45		 Hyogo   Electrical Characteristics of MAGFET With On-Chip Coil
Hirokazu Hashimoto (The Univ. of Tokyo), Makoto Ikeda, Kunihiro Asada (VDEC) ICD2007-59		 MAGFET ( Magnetic MOS Field-Effect Transistor ) is one of the magnetic sensors, which is capable of sensing a magnetic f... [more] ICD2007-59
pp.129-134
ICD, CPM 2007-01-18
09:25		 Tokyo Kika-Shinko-Kaikan Bldg. Study on Active Substrate Noise Cancelling Technique using Power Line di/dt Detector
Taisuke Kazama (Univ. of Tokyo), Makoto Ikeda, Kunihiro Asada (VDEC) 		 [more] CPM2006-130 ICD2006-172
pp.7-12
 Results 1 - 7 of 7  /   
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