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Committee Date Time Place Paper Title / Authors Abstract Paper #
CQ, MVE, IE
(Joint) [detail]
2011-03-08
11:40
Nagasaki Yasuragi IOUJIMA Chromatic Aberration Correction for Industial Vision Metrology
Susumu Hattori (Fukuyama Univ.), Harutaka Imoto (IHI), Yoshiyuki Ohnishi (VML), Kazuki Ikeda (IHI) IE2010-184 MVE2010-172
 [more] IE2010-184 MVE2010-172
pp.225-230
SANE 2010-05-21
14:35
Kanagawa National Defense Academy of Japan Experimental Comparison of Precision of Two Network GPS Surveying Systems: VRS and FKP -- Concurrent Positioning at Close Range Points --
Susumu Hattori, Shigekazu Katagiri (Fukuyama Univ.), Yoshiyuki Ohnishi (VML) SANE2010-12
 [more] SANE2010-12
pp.13-17
LOIS, IE, ITE-ME, IEE-CMN 2009-09-24
13:00
Hiroshima Hiroshima Univ. Comparison of Measurement Precision with CMOS and CCD Cameras -- Influence on Industrial Vision Metrology --
Susumu Hattori (Fukuyama Univ.), Yoshiyuki Ohnishi (VML) LOIS2009-18 IE2009-59
In industrial vision metrology, off-the shelf cameras with known or unknown interior orientation parameters are widely e... [more] LOIS2009-18 IE2009-59
pp.1-5
AP 2008-09-12
10:10
Kanagawa National Defense Academy 3D Measurement of a Parabola Anntena by Vision Metrololgy -- Easy and high-precision inspection --
Susumu Hattori (Fukuyama Univ.), Yoshiyuki Ohnishi (VML) AP2008-90
On the inspection of a parabola antenna, measurement precision of more than 1:10,000 is required. Available methods, whe... [more] AP2008-90
pp.91-94
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