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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
CQ, MVE, IE (Joint) [detail] |
2011-03-08 11:40 |
Nagasaki |
Yasuragi IOUJIMA |
Chromatic Aberration Correction for Industial Vision Metrology Susumu Hattori (Fukuyama Univ.), Harutaka Imoto (IHI), Yoshiyuki Ohnishi (VML), Kazuki Ikeda (IHI) IE2010-184 MVE2010-172 |
[more] |
IE2010-184 MVE2010-172 pp.225-230 |
SANE |
2010-05-21 14:35 |
Kanagawa |
National Defense Academy of Japan |
Experimental Comparison of Precision of Two Network GPS Surveying Systems: VRS and FKP
-- Concurrent Positioning at Close Range Points -- Susumu Hattori, Shigekazu Katagiri (Fukuyama Univ.), Yoshiyuki Ohnishi (VML) SANE2010-12 |
[more] |
SANE2010-12 pp.13-17 |
LOIS, IE, ITE-ME, IEE-CMN |
2009-09-24 13:00 |
Hiroshima |
Hiroshima Univ. |
Comparison of Measurement Precision with CMOS and CCD Cameras
-- Influence on Industrial Vision Metrology -- Susumu Hattori (Fukuyama Univ.), Yoshiyuki Ohnishi (VML) LOIS2009-18 IE2009-59 |
In industrial vision metrology, off-the shelf cameras with known or unknown interior orientation parameters are widely e... [more] |
LOIS2009-18 IE2009-59 pp.1-5 |
AP |
2008-09-12 10:10 |
Kanagawa |
National Defense Academy |
3D Measurement of a Parabola Anntena by Vision Metrololgy
-- Easy and high-precision inspection -- Susumu Hattori (Fukuyama Univ.), Yoshiyuki Ohnishi (VML) AP2008-90 |
On the inspection of a parabola antenna, measurement precision of more than 1:10,000 is required. Available methods, whe... [more] |
AP2008-90 pp.91-94 |
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