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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2020-11-30 14:30 |
Online | Online | Verification of effect by comparison of temperature cycle test and thermal shock test Yuri Saito, Matsuguma Osamu, Aoki Yuichi (ESPEC)  R2020-26 |
(To be available after the conference date) [more] | R2020-26 pp.17-20 |
| R | 2017-11-16 15:30 |
Osaka | Effects on Stresses in HALT Raphael Pihet, Takuya Hirata, Hideki Kawai, Aoki Yuichi (ESPEC) R2017-53 |
HALT (Highly Accelerated Limit Test) is an accelerated test which, by applying severe stresses, can identify the relativ... [more] | R2017-53 pp.13-16 |
|
| R | 2012-11-15 16:15 |
Osaka | The safety and evaluation test of Lithium-Ion Secondary Battery Manabu Okamoto, Hideki Kawai, Arata Okuyama, Yuichi Aoki (Espec Corp.) R2012-65 |
In a lithium-ion secondary battery, this report describes the principle and the subject of safety. The outline of the sa... [more] | R2012-65 pp.27-30 |
|
| R | 2011-11-18 14:10 |
Osaka | Temperature Humidity Test of Silver-Epoxy Isotropic Conductive Adhesive Takuya Hirata, Yuichi Aoki (ESPEC CORP.) R2011-35 |
To evaluate the reliability test condition for Isotropic Conductive Adhesive (ICA), we curried out various temperature h... [more] | R2011-35 pp.13-17 |
|
| R | 2010-11-19 14:25 |
Osaka | Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST) R2010-33 |
To clarify the failure-mode of crystalline-silicon photovoltaic modules on the thermal-cycle test, the modules were expo... [more] | R2010-33 pp.5-8 |
|
| EMD, R | 2009-02-20 14:25 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Evaluation of electric contact trouble caused by silicone.
-- Evaluation test with new environmental examination device -- Makito Morii, Hiroyuki Moriwaki (OMRON), Hideki Tanaka, Yoshitaka Ueki, Kenji Suzuki, Kimio Yoshizumi, Masanobu Nishikawa (espec) R2008-52 EMD2008-128 |
The phenomenon of the point of contact's becoming a loose connection with the gas generated from the compound of the org... [more] | R2008-52 EMD2008-128 pp.49-52 |
| CPM, ICD | 2008-01-18 16:10 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Reliability evaluation of lead free solder joint against vibration load under thermal circumstance Michiya Matsushima (Osaka Univ.), Toshiyuki Hamano (ESPEC), Kiyokazu Yasuda, Kozo Fujimoto (Osaka Univ.) CPM2007-148 ICD2007-159 |
The reliability of electronics solder joints is evaluated for each individual stress even if the electronics devices are... [more] | CPM2007-148 ICD2007-159 pp.117-122 |
| PRMU, MI | 2006-05-26 10:40 |
Aichi | Aichi Prefectural University | Development of Integrated Calibration Assistant Tool for Pixel-PSPMT Type Gamma Camera Toshio Modegi, Shin-ichiro Koyasu (DNP), Hiroyuki Mashino (Espec), Seiichi Yamamoto (KCCT), Hidehiro Iida (NCVC) |
We are developing small animal PET/ SPECT scanner systems and high-definition small pixel-PSPMT type gamma cameras for t... [more] | PRMU2006-29 MI2006-29 pp.55-60 |
| OPE, R, CPM | 2005-04-22 14:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Study of accelerate test method for Optical components Yuichi Aoki, Yasutoshi Nakagawa (ESPEC) |
We performed the HAST for adhesive of optical components to compared with High temperature & High humidity test such as ... [more] | R2005-4 CPM2005-4 OPE2005-4 pp.17-20 |
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