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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2023-02-28
16:15
Tokyo Kikai-Shinko-Kaikan Bldg
(Primary: On-site, Secondary: Online)
A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability
Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU) DC2022-91
The continuous pursuing of smaller technology nodes makes modern Integrated Circuits (ICs) more and more susceptible to ... [more] DC2022-91
pp.51-55
DC 2021-02-05
11:35
Online Online A Novel High Performance Scan-Test-Aware Hardened Latch Design
Ruijun Ma, Stefan Holst, Xiaoqing Wen (KIT), Aibin Yan (AHU), Hui Xu (AUST) DC2020-71
As modern technology nodes become more and more susceptible to soft-errors, many radiation hardened latch designs have b... [more] DC2020-71
pp.12-17
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