IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 9 of 9  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2013-01-25
15:25
Kanagawa Hitachi, Ltd., (Totsuka, Yokohama) Degradation Phenomenon of Electrical Contacts by using Micro-Sliding Mechanisms -- Anallysis of Time-Sequential Fluctuation Data (27) --
Shin-ichi Wada, Keiji Koshida (TMC), Shoko Nagai (Keio), Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-99
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] EMD2012-99
pp.9-14
EMD 2012-12-01
14:30
Chiba Chiba Institute of Technology Degradation phenomenon of electrical contacts using a hammering oscillating mechanism -- A fundamental study on the performance of the oscillating mechanism (25) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2012-86
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] EMD2012-86
pp.125-131
EMCJ, EMD 2012-07-20
13:15
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance (24) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-42 EMD2012-17
Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] EMCJ2012-42 EMD2012-17
pp.7-12
EMD, CPM, OME 2012-06-22
17:25
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism(22) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-15 CPM2012-32 OME2012-39
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-15 CPM2012-32 OME2012-39
pp.41-46
EMD 2012-05-25
14:20
Miyagi Tohoku Bunka Gakuen Univ. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its Model (21) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-3
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-3
pp.13-18
EMD 2012-01-20
13:35
Kanagawa   Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (20) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-112
pp.1-6
EMD 2011-11-18
16:15
Akita Akita Univ. Tegata Campus Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102
Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-os... [more] EMD2011-102
pp.189-194
EMD 2011-10-21
12:35
Tokyo Tachikawa-Shiminn-kaikan Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism -- Contact Resistance (17) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-57
pp.1-6
EMD, EMCJ 2011-07-15
12:20
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance (16) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2011-61 EMD2011-20
Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMCJ2011-61 EMD2011-20
pp.1-6
 Results 1 - 9 of 9  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan