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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| ED, CPM, LQE |
2021-11-25
15:25 |
Online |
Online |
Optical characterization of c-plane Al0.83In0.17N/GaN lattice-matched heterostructures
Liyang Li, Kohei Shima (Tohoku Univ.), Mizuki Yamanaka (Nagoya Inst. Tech.), Kazunobu Kojima (Tohoku Univ.), Takashi Egawa (Nagoya Inst. Tech.), Akira Uedono (Univ. of Tsukuba), Ishibashi Shoji (AIST), Tetsuya Takeuchi (Meijo Univ.), Makoto Miyoshi (Nagoya Inst. Tech.), Shigefusa Chichibu (Tohoku Univ.)  ED2021-24 CPM2021-58 LQE2021-36 |
Room-temperature (RT) time-resolved photoluminescence (PL) and spatially resolved cathodoluminescence (CL) measurements ... [more] |
ED2021-24 CPM2021-58 LQE2021-36
pp.45-50 |
| ED, LQE, CPM |
2015-11-26
11:45 |
Osaka |
Osaka City University Media Center |
Electronic and optical characteristics of an m-plane freestanding GaN substrate grown by hydride vapor phase epitaxy on a GaN seed crystal synthesized by the ammonothermal method using an acidic mineralizer
Kazunobu Kojima (Tohoku Univ.), Yusuke Tsukada (MCC), Erika Furukawa, Makoto Saito (Tohoku Univ.), Yutaka Mikawa, Shuichi Kubo, Hirotaka Ikeda, Kenji Fujito (MCC), Akira Uedono (Tsukuba Univ.), Shigefusa F. Chichibu (Tohoku Univ.) ED2015-71 CPM2015-106 LQE2015-103 |
[more] |
ED2015-71 CPM2015-106 LQE2015-103
pp.15-19 |
| SDM |
2014-02-28
11:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Impact of Back Grind Damage on Si Wafer Thinning for 3D Integration
Yoriko Mizushima (Fujitsu Lab./Tokyo Inst. of Tech.), Youngsuk Kim (Tokyo Inst. of Tech./Disco), Tomoji Nakamura (Fujitsu Lab.), Ryuichi Sugie, Hideki Hashimoto (Toray Research Center), Akira Uedono (Univ. of Tsukuba), Takayuki Ohba (Tokyo Inst. of Tech.) SDM2013-167 |
Ultra-thin wafer is indispensable for bumpless 3D stacking. To know the thinning damage in detail, an atomic level defec... [more] |
SDM2013-167
pp.13-18 |
| SDM |
2010-02-05
15:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Defects in Cu/low-k Interconnects Probed Using Monoenergetic Positron Beams
Akira Uedono (Tsukuba Univ.), Naoya Inoue, Y. Hayashi, K. Eguchi, T. Nakamura, Y. Hirose, Masaki Yoshimaru (STARC), Nagayasu Oshima, Toshiyuki Ohdaira, R. Suzuki (National Institute of Advanced Industrial Science and Technology) SDM2009-190 |
Defects in SiOCH/Cu damascene structures were probed using monoenergetic positron beams. Doppler broadening spectra of t... [more] |
SDM2009-190
pp.49-52 |
| ED, LQE, CPM |
2009-11-19
11:40 |
Tokushima |
Univ. of Tokushima (Josanjima Campus, Kogyo-Kaikan) |
Exciton emission mechanism in AlN epitaxial films
Takeyoshi Onuma, Kouji Hazu (Tohoku Univ.), Takayuki Sota (Waseda Univ.), Akira Uedono (Univ. of Tsukuba), Shigefusa F. Chichibu (Tohoku Univ.) ED2009-134 CPM2009-108 LQE2009-113 |
Exciton fine structures were observed in partially polarized optical reflectance and cathodoluminescence (CL) spectra of... [more] |
ED2009-134 CPM2009-108 LQE2009-113
pp.31-34 |
| SDM |
2006-06-21
14:55 |
Hiroshima |
Faculty Club, Hiroshima Univ. |
Characterization of open volumes in high-k gate dielectrics by using monoenergetic positron beams
Akira Uedono, T. Otsuka, K. Ito, K. Shiraishi, Kikuo Yamabe (Univ. of Tsukuba), Seiichi Miyazaki (Hiroshima Univ.), Naoto Umezawa, Toyohiro Chikyow (NIMS), Toshiyuki Ohdaira, R. Suzuki (AIST), Seiji Inumiya, Satoshi Kamiyama (Selete), Yasushi Akasaka (TEL), Yasuo Nara (Selete), Keisaku Yamada (Waseda Uni.) |
[more] |
SDM2006-46
pp.25-30 |
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