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All Technical Committee Conferences (Searched in: Recent 10 Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2024-06-21 14:00 |
Osaka |
Kwansei Gakuin Univ., Umeda Campus (Osaka) |
[Invited Talk]
Demonstration of AlN-Based Vertical p-n Diodes with Distributed Polarization Doping Takeru Kumabe (Nagoya Univ.), Akira Yoshikawa (Asahi Kasei), Seiya Kawasaki, Maki Kushimoto, Yoshio Honda, Manabu Arai, Jun Suda, Hiroshi Amano (Nagoya Univ.) SDM2024-22 |
AlN and high-Al-content AlGaN attract great attention as materials for next-generation electronic device applications. A... [more] |
SDM2024-22 pp.13-16 |
MI |
2021-03-17 13:15 |
Online |
Online (Online) |
Applications of hybrid reconstruction combining PET and Compton imaging Hideaki Tashima, Eiji Yoshida (NIRS-QST), Takumi Nishina (Chiba Univ.), Sodai Takyu, Fumihiko Nishikido (NIRS-QST), Mikio Suga (Chiba Univ.), Hidekatsu Wakizaka, Miwako Takahashi, Kotaro Nagatsu, Atsushi Tsuji (NIRS-QST), Kei Kamada, Akira Yoshikawa (C&A/Tohoku Univ.), Katia Parodi (LMU), Taiga Yamaya (NIRS-QST) MI2020-94 |
We have been developing WGI enabling simultaneous measurement of PET and Compton imaging. This study developed a hybrid ... [more] |
MI2020-94 pp.203-206 |
LQE, CPM, ED |
2020-11-26 11:55 |
Online |
Online (Online) |
265 nm AlGaN-based LEDs grown on AlN substrates studied by electroluminescence and photoluminescence methods Ryota Ishii (Kyoto Univ.), Akira Yoshikawa, Kazuhiro Nagase (Asahi Kasei Corporation), Mitsuru Funato, Yoichi Kawakami (Kyoto Univ.) ED2020-6 CPM2020-27 LQE2020-57 |
[more] |
ED2020-6 CPM2020-27 LQE2020-57 pp.21-24 |
US |
2020-09-28 13:50 |
Online |
Online (Online) |
Fast Scanning Method for Measuring Material Homogeneity using the Line-Focus-Beam Ultrasonic-Material-Characterization System Yuji Ohashi, Yuui Yokota, Akihiro Yamaji, Masao Yoshino, Shunnsuke Kurosawa, Kei Kamada, Hiroki Sato, Satoshi Toyoda, Takashi Hanada, Akira Yoshikawa (Tohoku Univ.) US2020-34 |
We proposed and demonstrated a new method for measuring material homogeneity using fast scanning technique with the line... [more] |
US2020-34 pp.41-44 |
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