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Paper #
SDM
2006-06-21
14:30
Hiroshima
Faculty Club, Hiroshima Univ.
Local carrier trapping and their detrapping process at constant voltage stress in La2O3-Al2O3 composite films
Toshifumi Sago
,
Akiyoshi Seko
,
Mitsuo Sakashita
,
Akira Sakai
,
Masaki Ogawa
,
Shigeaki Zaima
(
Nagoya Univ.
)
We observed changes in local leakage currents in La2O3-Al2O3 composite films under constant voltage stress using conduct...
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SDM2006-45
pp.19-24
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