IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
PRMU 2016-10-21
11:10
Miyazaki   Photometric Stereo by SEM Image Utilizing Region Division
Hiroki Matsuse, Gou Koutaki, Keiichi Uchimura (Kumamoto Univ.), Atsushi Miyamoto (Hitachi) PRMU2016-100
In this paper, we present a three-dimensional (3D) reconstruction method for semiconductor pattern using a scanning elec... [more] PRMU2016-100
pp.55-60
IBISML 2012-03-13
15:05
Tokyo The Institute of Statistical Mathematics A Method for Packet Loss Rate Estimation Using Active and Passive Measurements
Atsushi Miyamoto, Kazuho Watanabe, Kazushi Ikeda (NAIST) IBISML2011-104
It is an important problem for a network manager to understand characteristics of a network. A method for estimating an ... [more] IBISML2011-104
pp.117-121
NC 2010-07-27
14:55
Kyoto Kyoto University Hierarchical Bayes method for NIRS-DOT inverse problem and its phase diagrams
Atsushi Miyamoto, Kazuho Watanabe, Kazushi Ikeda (NAIST), Masa-aki Sato (ATR) NC2010-38
The NIRS-DOT is a method to reconstruct tomographic images from the data by solving the linear equations, which have amb... [more] NC2010-38
pp.51-56
NC, MBE
(Joint)
2010-03-10
14:10
Tokyo Tamagawa University Variational Bayes approach for NIRS-DOT inverse problem
Atsushi Miyamoto, Kazuho Watanabe, Kazushi Ikeda (NAIST), Masa-aki Sato (ATR) NC2009-137
NIRS-DOT is tomography which is reconstructed from NIRS data. NIRS-DOT requires to solve the inverse problem which has i... [more] NC2009-137
pp.291-296
EA, US
(Joint)
2009-01-29
11:00
Kyoto   Nondestructive evaluation of a micro crack by a low power pulsed laser.
Atsushi Miyamoto, Mami Matsukawa (Doshisha univ.) US2008-72
A simple measurement technique to evaluate micro cracks in a solid PMMA specimen is reported. Taking advantages of a two... [more] US2008-72
pp.1-6
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan