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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2008-11-17
13:50		 Fukuoka Kitakyushu Science and Research Park A Capture-Safe Test Generation Scheme for At-speed Scan Testing
Atsushi Takashima, Yuta Yamato, Hiroshi Furukawa, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyusyu Institute of Technology) VLD2008-62 DC2008-30		 Capture-safety, defined as the avoidance of any timing error due to unduly high switching activity in capture mode durin... [more] VLD2008-62 DC2008-30
pp.13-18
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