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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
OME, SDM 2019-04-26
15:20
Kagoshima Yakushima Environmental and Culture Village Center Heterojunction channel IGZO Thin-Film Transistor
Mamoru Furuta, Daichi Koretomo, Ryunosuke Higashi, Shuhei Hamada (KUT.) SDM2019-6 OME2019-6
 [more] SDM2019-6 OME2019-6
pp.23-26
EID, SDM, ITE-IDY [detail] 2018-12-25
11:45
Kyoto   Device Using Thin Film of GTO by MistCVD Method
Yuta Takishita (Ryukoku Univ.), Daichi Koretomo, Yusaku Magari, Mamoru Furuta (KUT), Tokiyoshi Matsuda, Mutsumi Kimura (Ryukoku Univ.)
 [more]
EID, SDM, ITE-IDY [detail] 2018-12-25
14:30
Kyoto   Dependence of thermoelectric properties and structure of Ga-Sn-O thin films on annealing
Yoku Ikeguchi, Tatsuya Aramaki (Ryukoku Univ.), Kenta Umeda, Mutsunori Uenuma (NAIST), Daichi Koretomo, Yusaku Magari, Mamoru Furuta (KUT), Mutsumi Kimura (Ryukoku Univ.)
 [more]
SDM, OME 2018-04-07
13:10
Okinawa Okinawaken Seinen Kaikan [Invited Talk] properties of IGZO thin-film transistors.
Mamoru Furuta, Aman S G Mehadi, Daichi Koretomo, Yusaku Magari (Kochi Univ. of Tech.) SDM2018-6 OME2018-6
(To be available after the conference date) [more] SDM2018-6 OME2018-6
pp.25-28
SDM, OME 2018-04-07
13:50
Okinawa Okinawaken Seinen Kaikan Thin-film transistor with InGaZnOx-hetero-channel
Ryunosuke Higashi, Daichi Koretomo, Hirosato Tanaka (Kochi Univ. of Tech.), Seiichiro Takahashi, Isamu Yashima (Mitsui Mining & Smelting Co.,LTD), Mamoru Furuta (Kochi Univ. of Tech.) SDM2018-7 OME2018-7
(To be available after the conference date) [more] SDM2018-7 OME2018-7
pp.29-31
SDM, OME 2016-04-09
10:50
Okinawa Okinawa Prefectural Museum & Art Museum Device simulation analysis of carrier transport in In-Ga-Zn-O thin-film transistors -- Influence of carrier concentration in back-channel region --
Daichi Koretomo, Tatsuya Toda (KUT), Tokiyoshi Matsuda, Mutsumi Kimura (Ryukoku Univ.), Mamoru Furuta (KUT) SDM2016-14 OME2016-14
The influence of high carrier concentration region in In-Ga-Zn-O (IGZO ) on the electrical properties of a bottom-gate I... [more] SDM2016-14 OME2016-14
pp.57-60
 Results 1 - 6 of 6  /   
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