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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMD, EMCJ |
2011-07-15 12:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Degradation Phenomenon of Electrical Contacts by a Tapping Device
-- A tapping device for trial (3) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Koki Takeda, Daiki Ishizuka, Kunio Yanagi, Hiroaki Kubota (TMC), Nobuhiro Kuga (YNU), Koichiro Sawa (NIT) EMCJ2011-62 EMD2011-21 |
Authors have developed and made a handy “tapping device (TPD)” experimentally without a special stage for the inspection... [more] |
EMCJ2011-62 EMD2011-21 pp.7-12 |
EMD |
2011-01-28 15:40 |
Tokyo |
Japan Aviation Electronics Industry,Limited |
Degradation phenomenon of electrical contacts by a tapping device
-- A tapping device for trial (1) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-141 |
Authors have studied the influence on electrical contact resistance by external micro-oscillation using a hammering osci... [more] |
EMD2010-141 pp.35-40 |
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