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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, CPSY 2015-12-18
Kyoto Kyoto Institute of Technology Evaluation of Soft Error Tolerance of Redundant Flip-Flop in 65nm Bulk and FD-SOI Processes.
Eiji Sonezaki, Kubota Kanto, Masaki Masuda, Shohei Kanda, Jun Furuta, Kazutoshi Kobayashi (KIT) ICD2015-83 CPSY2015-96
According to process down scaling, LSI becomes less reliable for soft errors. To increase the tolerance of FFs for soft ... [more] ICD2015-83 CPSY2015-96
(Joint) [detail]
Oita B-ConPlaza Voltage Dependence of Single Event Transient Pulses on 65nm Silicon-on-Thin-BOX and Bulk Processes
Eiji Sonezaki, Kuiyuan Zhang, Jun Furuta, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2014-84 DC2014-38
Recently, the growth of power consumption has been serious by process
scaling. The lower voltage is most effective to i... [more]
VLD2014-84 DC2014-38
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