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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-29 11:20 |
Osaka |
Ritsumeikan University, Osaka Ibaraki Campus |
SADP-Cut Aware Two-color Grid Routing Hatsuhiko Miura, Mitsuru Hasegawa, Kunihiro Fujiyoshi (TUAT) VLD2016-58 DC2016-52 |
Self-Aligned Double Patterning (SADP) is one of the promising manufacturing option to overcome the limit of miniaturizat... [more] |
VLD2016-58 DC2016-52 pp.85-90 |
VLD, IPSJ-SLDM |
2016-05-11 10:25 |
Fukuoka |
Kitakyushu International Conference Center |
Self-Aligned Double Patterning-Aware Two-color Grid Routing Hatsuhiko Miura, Mitsuru Hasegawa, Taku Hirukawa, Kunihiro Fujiyoshi (TUAT) VLD2016-2 |
Self-Aligned Double Patterning (SADP) is one of the promising manufacturing option to overcome the limit of miniaturizat... [more] |
VLD2016-2 pp.5-10 |
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