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All Technical Committee Conferences (Searched in: Recent 10 Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2025-02-28 16:20 |
Tokyo | NIT | A Summary of 32nd International Conference on Electrical Contacts/69th IEEE Holm Conference on Electrical Contacts Hideaki Sone (Tohoku Univ.), Makoto Hasegawa (Chitose Inst. of Sci. and Tech.)  EMD2024-45 |
A summary report of 32nd International Conference on Electrical Contacts together with 69th IEEE Holm Conference on Elec... [more] | EMD2024-45 pp.77-82 |
| EMCJ | 2024-11-15 09:15 |
Overseas | Kumwell Academy (Thailand) | Analysis of Lossy Side-Channel Waveform in Electromagnetic Information Leakage Hideaki Sone (Tohoku Univ.), Yuichi Hayashi (NAIST) EMCJ2024-71 |
Correlation Power Analysis (CPA) against cryptographic chips analyzes side-channel waveforms caused by transient current... [more] | EMCJ2024-71 pp.5-7 |
| IA, ICSS | 2024-06-17 16:00 |
Okayama | Okayama University (Primary: On-site, Secondary: Online) |
[Invited Talk]
Basic SecCap: Practical Security Education Based on Inter-University Collaboration Tokumi Yokohira (Okayama Univ.), Hideaki Sone (Tohoku Univ.), Hideki Sunahara (Keio Univ.), Satoru Izumi (Tohoku Unvi./NIT, Sendai College), Miyuki Hirose (Kyutech/TDU), Daiya Kato (Keio Univ.) IA2024-6 ICSS2024-6 |
In order to provide practical education on IT technologies, the Ministry of Education, Culture, Sports, Science and Tech... [more] | IA2024-6 ICSS2024-6 p.35 |
| ISEC | 2021-05-19 11:05 |
Online | Online | [Invited Talk]
Six-Card Finite-Runtime XOR Protocol with Only Random Cut (from APKC 2020) Kodai Toyoda (Tohoku Univ.), Daiki Miyahara (Tohoku Univ./AIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2021-3 |
In this invited talk, we introduce the paper ``Six-Card Finite-Runtime XOR Protocol with Only Random Cut'' by Kodai Toyo... [more] | ISEC2021-3 p.17 |
| WBS, IT, ISEC | 2021-03-04 14:55 |
Online | Online | A Physical Zero-knowledge Proof for Cryptarithmetic Using Dihedral Cards Raimu Isuzugawa (Tohoku Univ.), Daiki Miyahara, Takaaki Mizuki (Tohoku Univ./AIST), Hideaki Sone (Tohoku Univ.) IT2020-135 ISEC2020-65 WBS2020-54 |
(To be available after the conference date) [more] | IT2020-135 ISEC2020-65 WBS2020-54 pp.139-145 |
| IA | 2020-10-01 11:40 |
Online | Online | Ethical Education on Information Security Mind for Practical Security Learning Yoshinari Kanaya (Tohoku Univ.), Daisuke Kotani (Kyoto Univ.), Katsuyoshi Iida (Hokkaido Univ.), Hideaki Sone (Tohoku Univ.) IA2020-2 |
Practical education on information security may cause trouble if any student in the course tries the new education again... [more] | IA2020-2 pp.6-9 |
| EMCJ, IEE-SPC (Joint) |
2019-11-15 15:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Measurement of an Effect of Resolution of Side Channel Waveform on Acquisition of Secret Key Kohei Utsumi (Tohoku Univ), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ) EMCJ2019-73 |
A side-channel attack is known as a serious threat which can obtain a secret key by analyzing physical information leaka... [more] | EMCJ2019-73 pp.13-16 |
| ISEC | 2019-05-17 17:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Five-Card AND Protocol in Committed Format Using Only Practical Shuffles (from APKC 2018) Yuta Abe (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2019-11 |
In this invited talk, we introduce the paper ``Five-Card AND Protocol in Committed Format Using Only Practical Shuffles'... [more] | ISEC2019-11 p.49 |
| COMP | 2018-12-12 15:35 |
Miyagi | Tohoku University | A Millionaire Protocol Using a Standard Deck of Cards Daiki Miyahara (Tohoku Univ./AIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) COMP2018-38 |
(To be available after the conference date) [more] | COMP2018-38 pp.39-45 |
| EMCJ, IEE-EMC, IEE-MAG | 2018-11-22 15:10 |
Overseas | KAIST | [Poster Presentation]
A Specification Method of Faulty Bytes in Cryptographic Module Using EM Information Leakage Naoto Saga (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-68 |
Fault analysis methods such as Differential Fault Analysis (DFA) need ciphertexts which have specific timing faults and ... [more] | EMCJ2018-68 pp.39-40 |
| EMCJ, IEE-EMC, IEE-MAG | 2018-11-22 15:10 |
Overseas | KAIST | [Poster Presentation]
Influence of IEMI considering injected signal phase on faulty outputs in a cryptographic module Mitsuki Takenouchi (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-79 |
In a fault injection method based on Intentional Electromagnetic Interference (IEMI) from a power line, the phase of the... [more] | EMCJ2018-79 pp.61-62 |
| EMD | 2018-11-09 15:55 |
Tokyo | The University of Electro-Communications | Study on the Effect of Surface Condition on High-Frequency Transmission Characteristics Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2018-46 |
When a connector connecting electric devices has loose contact or degradation over time, it causes contact failure. In p... [more] | EMD2018-46 pp.33-36 |
| EMCJ | 2018-07-27 15:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A study on measuring method of influence of contact force of contact points on signal transmission characteristics Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2018-32 |
When a contact point of a connector connecting electric devices has poor maintenance or degradation over time, it causes... [more] | EMCJ2018-32 pp.61-66 |
| HWS, ISEC, SITE, ICSS, EMM, IPSJ-CSEC, IPSJ-SPT [detail] | 2018-07-25 16:15 |
Hokkaido | Sapporo Convention Center | Secure Multiparty Computation of Ranking Using a Deck of Cards Ken Takashima, Yuta Abe, Tatsuya Sasaki, Daiki Miyahara (Tohoku Univ.), Kazumasa Shinagawa (Tokyo Inst. of Tech./AIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2018-30 SITE2018-22 HWS2018-27 ICSS2018-33 EMM2018-29 |
(To be available after the conference date) [more] | ISEC2018-30 SITE2018-22 HWS2018-27 ICSS2018-33 EMM2018-29 pp.163-169 |
| ISEC | 2018-05-16 10:50 |
Tokyo | Ookayama Campus, Tokyo Institute of Technology | Improvements on Physical Zero-knowledge Proof for Kakuro Daiki Miyahara, Tatsuya Sasaki, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2018-3 |
(To be available after the conference date) [more] | ISEC2018-3 pp.17-23 |
| ISEC | 2018-05-16 11:30 |
Tokyo | Ookayama Campus, Tokyo Institute of Technology | [Invited Talk]
The Minimum Number of Cards in Practical Card-Based Protocols (from ASIACRYPT 2017) Daiki Miyahara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2018-4 |
In this invited talk, we introduce the paper ``The Minimum Number of Cards in Practical Card-Based Protocols'' by J. Kas... [more] | ISEC2018-4 p.25 |
| EMCJ | 2017-11-22 14:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Study on the Effect of Clock Rise Time on Fault Occurrence under IEMI Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-71 |
The intentional electromagnetic interference (IEMI) fault-injection method generates a fault by injecting a glitch into ... [more] | EMCJ2017-71 pp.41-44 |
| EMCJ | 2017-11-22 15:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Study on Evaluation Method for EM Information Leakage Utilizing Controlled Image Displaying Gentaro Tanabe (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-74 |
Evaluation of electromagnetic information leakage from display devices are generally conducted by actual attacks retriev... [more] | EMCJ2017-74 pp.57-62 |
| EMCJ | 2017-11-22 16:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Efficient Evaluation Method for Information Leakage of Cryptographic Devices Based on Frequency Selection Airi Sugimoto (Tohoku Univ.), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-75 |
Evaluating electromagnetic information leakage from a cryptographic device takes a considerable amount of time because o... [more] | EMCJ2017-75 pp.63-66 |
| EMD | 2017-11-17 13:20 |
Tokyo | The University of Electro-Communications | The influence of contact conditions of gap on the frequency characteristics of the transmission line Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2017-47 |
When a connector connecting electric devices has loose contact or degradation over time, it causes contact failure. Prev... [more] | EMD2017-47 pp.27-30 |
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